Chemical bath deposition (CBD) of zinc selenide (ZnSe) thin films and characterisation

2016 ◽  
Vol 15 (3) ◽  
pp. 222-227 ◽  
Author(s):  
Suresh Sagadevan ◽  
Isha Das
Keyword(s):  
Thin Films ◽  
Zinc Selenide ◽  
Chemical Bath Deposition ◽  
Znse Thin Films

The effect of annealing time on zinc selenide thin films deposited by photo-assisted chemical bath deposition

2020 ◽  
Vol 140 ◽  
pp. 109381
Author(s):  
D.D. Hile ◽  
H.C. Swart ◽  
S.V. Motloung ◽  
R.E. Kroon ◽  
K.O. Egbo ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Selenide ◽  
Chemical Bath Deposition ◽  
Annealing Time

Effect of hydrazine hydrate as complexing agent in the synthesis of zinc selenide thin films by chemical bath deposition

2020 ◽  
Vol 693 ◽  
pp. 137707
Author(s):  
D.D. Hile ◽  
H.C. Swart ◽  
S.V. Motloung ◽  
T.E. Motaung ◽  
K.O. Egbo ◽  
...  
Keyword(s):  
Thin Films ◽  
Hydrazine Hydrate ◽  
Zinc Selenide ◽  
Chemical Bath Deposition ◽  
Complexing Agent

Synthesis and Non-Destructive Characterization of Zinc Selenide Thin Films

2019 ◽  
Vol 74 (11) ◽  
pp. 993-999 ◽  
Author(s):  
Brijesh Kumar Yadav ◽  
Pratima Singh ◽  
Dharmendra Kumar Pandey
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Zinc Selenide ◽  
Near Infrared ◽  
Raman Spectroscopic ◽  
Curve Fit ◽  
Polynomial Curve ◽  
Evaporation Technique ◽  
Znse Thin Films ◽  
Fifth Order

AbstractThe present work encloses the deposition of three zinc selenide (ZnSe) thin films of thickness 175 nm, 243 nm, and 286 nm using thermal evaporation technique under a vacuum of 5 × 10−5 mbar. The deposited ZnSe thin films are characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), surface profilometer, ultraviolet (UV)-visible (Vis)-near-infrared (NIR) spectrophotometer and Raman spectroscopic measurements. The structure and morphology measurements reveal that the deposited ZnSe material is nanocrystalline having a cubic structure whose crystallinity increases with an increase in film thickness/evaporation rate. The optical band gap estimated from the optical transmission spectra of the films is found to be 2.62 eV, 2.60 eV, and 2.57 eV, respectively, which decreases with an increase in film thickness. The estimation and polynomial curve fit analysis of refractive index, extinction coefficient, and dielectric constant indicates that these physical quantities are fifth-order polynomial function of wavelength. The obtained results are compared and analysed for justification and application of ZnSe thin films.

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