Femtosecond spin dynamics of ferromagnetic thin films and nanodots probed by spin polarized photoemission electron microscopy

2008 ◽  
Vol 41 (16) ◽  
pp. 164002 ◽  
Author(s):  
B Heitkamp ◽  
F Kronast ◽  
L Heyne ◽  
H A Dürr ◽  
W Eberhardt ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Spin Dynamics ◽  
Photoemission Electron Microscopy ◽  
Ferromagnetic Thin Films ◽  
Spin Polarized ◽  
Photoemission Electron

Photoemission electron microscopy of diindenoperylene thin films

2008 ◽  
Vol 78 (7) ◽  
Author(s):  
M. B. Casu ◽  
I. Biswas ◽  
M. Nagel ◽  
P. Nagel ◽  
S. Schuppler ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Photoemission Electron Microscopy ◽  
Photoemission Electron

X-ray photoemission electron microscopy studies of local magnetization in Py antidot array thin films

2012 ◽  
Vol 85 (18) ◽  
Author(s):  
K. J. Merazzo ◽  
C. Castán-Guerrero ◽  
J. Herrero-Albillos ◽  
F. Kronast ◽  
F. Bartolomé ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Local Magnetization ◽  
Photoemission Electron Microscopy ◽  
X Ray ◽  
Photoemission Electron

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

scholarly journals Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors

2017 ◽  
Vol 23 (S1) ◽  
pp. 1504-1505
Author(s):  
Taisuke Ohta ◽  
Morgann Berg ◽  
Kunttal Keyshar ◽  
Jason M. Kephart ◽  
Thomas E. Beechem ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electronic Properties ◽  
Photoemission Electron Microscopy ◽  
2D Crystals ◽  
Photoemission Electron
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