A versatile electromagnetic balance

1966 ◽  
Vol 43 (5) ◽  
pp. 335-338 ◽  
Author(s):  
H E Blayden
2020 ◽  
Vol 1650 ◽  
pp. 022047
Author(s):  
Wenliang Peng ◽  
Huise Li ◽  
Ying Hu ◽  
Zexin Zheng

2006 ◽  
Vol 2006.7 (0) ◽  
pp. 299-300
Author(s):  
Kenji MIYAMOTO ◽  
Tomoya JOMORI ◽  
Koji SUGANO ◽  
Toshiyuki TSUCHIYA ◽  
Osamu TABATA

1960 ◽  
Vol 31 (5) ◽  
pp. 537-539 ◽  
Author(s):  
Kenneth A. Lincoln

2015 ◽  
Vol 645-646 ◽  
pp. 817-823
Author(s):  
Yu Wen Zhao ◽  
Yun Peng Song ◽  
Sen Wu ◽  
Xing Fu

Atomic force microscope (AFM) is widely used to measure nanoforce in the analysis of nanomechanical and biomechanical properties. As the critical factor in the nanoforce measurement, the stiffness of the AFM cantilever must be determined properly. In this paper, an accurate and SI-traceable calibration method is presented to obtain the stiffness of the AFM cantilever in the normal direction. The calibration system consists of a homemade AFM head and an ultra-precision electromagnetic balance. The calibration is based on the Hooke's law i.e. the stiffness is equal to the force divided by the deflection of the cantilever. With this system, three kinds of cantilevers were calibrated. The relative standard deviation is better than 1%. The results of these experiments showed good accuracy and repeatability.


1933 ◽  
Vol 4 (10) ◽  
pp. 546-548
Author(s):  
D. S. Ainslie

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