Structure determination of the and surface alloy phases by medium-energy ion scattering

1999 ◽  
Vol 11 (8) ◽  
pp. 1889-1901 ◽  
Author(s):  
D Brown ◽  
T C Q Noakes ◽  
D P Woodruff ◽  
P Bailey ◽  
Y Le Goaziou
1990 ◽  
Vol 202 ◽  
Author(s):  
J. Vrijmoeth ◽  
P.M. Zagwijn ◽  
J.W.M. Frenken ◽  
J.F. van der Veen

ABSTRACTThe surface structure of epitaxial NiSi2 films grown on Si (111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the NiSi2 (111) surface are resolved.The topology of the NiSi2 (111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.


1990 ◽  
Vol 208 ◽  
Author(s):  
J. Vrijmoeth ◽  
P. M. Zagwijn ◽  
J. W. M. Frenken ◽  
J. F. Van Der Veen

ABSTRACTThe surface structure of epitaxial Nisi2 films grown on Si(111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the Nisi2 (111) surface are resolved.The topology of the Nisi2(111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.


1989 ◽  
Vol 40 (5) ◽  
pp. 3121-3128 ◽  
Author(s):  
J. Vrijmoeth ◽  
A. G. Schins ◽  
J. F. van der Veen

1988 ◽  
Vol 38 (2) ◽  
pp. 1585-1588 ◽  
Author(s):  
P. M. J. Marée ◽  
K. Nakagawa ◽  
J. F. van der Veen ◽  
R. M. Tromp

2011 ◽  
Vol 605 (1-2) ◽  
pp. 220-224 ◽  
Author(s):  
Johan Gustafson ◽  
Andrew R. Haire ◽  
Christopher J. Baddeley

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