Structure Determination of the Nisi2 (111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

ABSTRACTThe surface structure of epitaxial Nisi2 films grown on Si(111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the Nisi2 (111) surface are resolved.The topology of the Nisi2(111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.