A multi-frequency AC potential drop technique for the detection of small cracks

1992 ◽  
Vol 3 (1) ◽  
pp. 62-74 ◽  
Author(s):  
I S Hwang
2021 ◽  
Vol 2091 (1) ◽  
pp. 012047
Author(s):  
P N Shkatov

Abstract Traditional measuring techniques often lead to errors due to the need to register signals in both defective and defect-free areas. In this paper, we introduce an alternating current potential drop technique with detuning from the influence of variations in the electromagnetic properties of the metal achieved by registering a signal only at the defective site. We show that, with an appropriate choice of measurement parameters, the use of the proposed technique leads to an increase in sensitivity to the crack depth as well as to an increase in the measurement range.


Author(s):  
Fumio Takeo ◽  
Masumi Saka ◽  
Seiichi Hamada ◽  
Manabu Hayakawa

D-C potential drop (DCPD) technique is a powerful tool for quantitative NDE of cracks. The technique using four probes which are in close proximity to each other has been proposed for NDE of surface cracks; that is the closely coupled probes potential drop (CCPPD) technique. It has been shown that the sensitivity of CCPPD technique to evaluate a small crack is enhanced significantly in comparison with the usual method. On the other hand, since CCPPD technique has been developed to evaluate a small crack sensitively, it is not fit to evaluate deep cracks which are sometimes found in the structural components of power plants. The objective of this study was to enhance the sensitivity of evaluating deep surface cracks. By extending the distance between current input and output probes, the change in potential drop with the change in the depth of deeper crack becomes large. But the voltage of potential drop becomes small to measure, because the current density in the material becomes low. The voltage of the potential drop can be increased by increasing the applying current, but the current would also be limited by the equipment or contacting probes. Then the way to select the appropriate distances between probes from the viewpoints of the sensitivity and the required current has been shown.


JOM ◽  
1985 ◽  
Vol 37 (10) ◽  
pp. 44-49 ◽  
Author(s):  
Ioannis P. Vasatis ◽  
Regis M. Pelloux

1993 ◽  
Vol 10 (6) ◽  
pp. 333-341 ◽  
Author(s):  
M. SAKA ◽  
D. YUASA ◽  
H. ABÉ ◽  
K. SUGINO ◽  
H. KAGEYAMA

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