Full thermoelectric characterization of InAs nanowires using MEMS heater/sensors

Nanotechnology ◽

10.1088/0957-4484/25/30/305702 ◽

2014 ◽

Vol 25 (30) ◽

pp. 305702 ◽

Author(s):

S F Karg ◽

V Troncale ◽

U Drechsler ◽

P Mensch ◽

P Das Kanungo ◽

...

Keyword(s):

Inas Nanowires ◽

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Electrical Characterization of Vertical InAs Nanowires on Si

2007 65th Annual Device Research Conference ◽

10.1109/drc.2007.4373686 ◽

2007 ◽

Author(s):

C. Rehnstedt ◽

T. Martensson ◽

C. Thelander ◽

L. Samuelson ◽

L.-E. Wernersson

Keyword(s):

Electrical Characterization ◽

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In-situ mechanical characterization of wurtzite InAs nanowires

Solid State Communications ◽

10.1016/j.ssc.2012.07.005 ◽

2012 ◽

Vol 152 (19) ◽

pp. 1829-1833 ◽

Author(s):

Róbert Erdélyi ◽

Morten Hannibal Madsen ◽

György Sáfrán ◽

Zoltán Hajnal ◽

István Endre Lukács ◽

...

Keyword(s):

Mechanical Characterization ◽

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Structural characterization of GaAs and InAs nanowires by means of Raman spectroscopy

Journal of Applied Physics ◽

10.1063/1.3026726 ◽

2008 ◽

Vol 104 (10) ◽

pp. 104311 ◽

Author(s):

N. Begum ◽

M. Piccin ◽

F. Jabeen ◽

G. Bais ◽

S. Rubini ◽

...

Keyword(s):

Raman Spectroscopy ◽

Structural Characterization ◽

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Vertical growth characterization of InAs nanowires grown by selective area growth on patterned InP(111)B substrate by a MOCVD method

Solid-State Electronics ◽

10.1016/j.sse.2020.107939 ◽

2020 ◽

pp. 107939

Author(s):

Chang-Hun Song ◽

Minwoo Kong ◽

yunchul Jang ◽

Sang Tae Lee ◽

Hyeong-Ho Park ◽

...

Keyword(s):

Selective Area Growth ◽

Vertical Growth ◽

Selective Area ◽

Growth Characterization ◽

Area Growth ◽

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Electrical characterization of chemical and dielectric passivation of InAs nanowires

Semiconductor Science and Technology ◽

10.1088/0268-1242/31/11/114004 ◽

2016 ◽

Vol 31 (11) ◽

pp. 114004 ◽

Author(s):

Gregory W Holloway ◽

Chris M Haapamaki ◽

Paul Kuyanov ◽

Ray R LaPierre ◽

Jonathan Baugh

Keyword(s):

Electrical Characterization ◽

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In situelectrical characterization of tapered InAs nanowires in a transmission electron microscope with ohmic contacts

Nanotechnology ◽

10.1088/0957-4484/26/15/155703 ◽

2015 ◽

Vol 26 (15) ◽

pp. 155703 ◽

Author(s):

Chao Zhang ◽

Mariya Neklyudova ◽

Liang Fang ◽

Qiang Xu ◽

Hui Wang ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Ohmic Contacts ◽

Transmission Electron ◽

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Fabrication and Structural Characterization of Vertical Free-Standing InAs Nanowires Hybridized with Ferromagnetic MnAs Nanoclusters

10.7567/ssdm.2013.ps-13-6 ◽

2013 ◽

Author(s):

H. Fujimagari ◽

S. Sakita ◽

S. Hara

Keyword(s):

Structural Characterization ◽

Free Standing ◽

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Scanned electrical probe characterization of carrier transport behavior in InAs nanowires

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2213267 ◽

2006 ◽

Vol 24 (4) ◽

pp. 2036 ◽

Author(s):

X. Zhou ◽

S. A. Dayeh ◽

D. Aplin ◽

D. Wang ◽

E. T. Yu

Keyword(s):

Carrier Transport ◽

Transport Behavior ◽

Inas Nanowires ◽

Electrical Probe

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Molecular beam epitaxial growth and characterization of InAs nanowires

10.17077/etd.005312 ◽

2020 ◽

Author(s):

Kailing Zhang

Keyword(s):

Epitaxial Growth ◽

Molecular Beam ◽

Molecular Beam Epitaxial ◽

Inas Nanowires ◽

Molecular Beam Epitaxial Growth

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Synthesis, contact printing, and device characterization of Ni-catalyzed, crystalline InAs nanowires

Nano Research ◽

10.1007/s12274-008-8009-4 ◽

2008 ◽

Vol 1 (1) ◽

pp. 32-39 ◽

Author(s):

Alexandra C. Ford ◽

Johnny C. Ho ◽

Zhiyong Fan ◽

Onur Ergen ◽

Virginia Altoe ◽

...

Keyword(s):

Device Characterization ◽

Contact Printing ◽

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