scholarly journals An electrostatic ion pump with nanostructured Si field emission electron source and Ti particle collectors for supporting an ultra-high vacuum in miniaturized atom interferometry systems

2016 ◽  
Vol 26 (12) ◽  
pp. 124003 ◽  
Author(s):  
Anirban Basu ◽  
Luis F Velásquez-García
Keyword(s):  
Field Emission ◽  
High Vacuum ◽  
Electron Source ◽  
Atom Interferometry ◽  
Ultra High Vacuum ◽  
Ion Pump ◽  
Emission Electron ◽  
Nanostructured Si

A Field Emission Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 6-7
Author(s):  
A. Tonomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
High Vacuum ◽  
High Resolution Electron Microscopy ◽  
Ultra High Vacuum ◽  
Electron Optics ◽  
Ion Pumps ◽  
High Brightness ◽  
Emission Electron ◽  
Resolution Electron

We have developed a field emission electron microscope. Although field emission gun requires ultra high vacuum and skillful technique, it brings about the favorable characteristics of high brightness and small energy spread. This characteristics will enable a significant progress in coherent electron optics and high resolution electron microscopy, especially in electron beam holography.Its column is Hitachi HU-11C Electron Microscope modified for ultra high vacuum operation, and it is evacuated with five ion pumps. Field emission gun is divided into two parts and is evacuated differentially with two ion pumps and a sublimation pump. The final pressures in these rooms are 5x10-10 Torr and 5x10-8 Torr respectively.

A Field Emission System For Transmission Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 298-299
Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Optical System ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Objective Lens ◽  
Electron Optical System ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Emission System

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).

The development of a 200kV monochromated field emission electron source

2014 ◽  
Vol 140 ◽  
pp. 37-43 ◽  
Author(s):  
Masaki Mukai ◽  
Judy S. Kim ◽  
Kazuya Omoto ◽  
Hidetaka Sawada ◽  
Atsushi Kimura ◽  
...  
Keyword(s):  
Field Emission ◽  
Electron Source ◽  
Emission Electron

Silicon Field Emission Electron Source With Individually Controllable Single Emitters

2021 ◽  
pp. 1-7
Author(s):  
Robert Lawrowski ◽  
Matthias Hausladen ◽  
Philipp Buchner ◽  
Rupert Schreiner
Keyword(s):  
Field Emission ◽  
Electron Source ◽  
Emission Electron

CNT field emission based ultra-high vacuum measurements

2015 ◽  
Author(s):  
Jian Zhang ◽  
Yangyang Zhao ◽  
Yongjun Cheng ◽  
Detian Li ◽  
Changkun Dong
Keyword(s):  
Field Emission ◽  
High Vacuum ◽  
Ultra High Vacuum

Energy Filtering of Schottky Field Emission Gun Using Fringe Field Monochromator

1999 ◽  
Vol 5 (S2) ◽  
pp. 646-647
Author(s):  
H.W. Mook ◽  
A.H.V. van Veen ◽  
P. Kruit
Keyword(s):  
Field Emission ◽  
Low Voltage ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Electron Gun ◽  
Fringe Field ◽  
Objective Lens ◽  
Electronic Band ◽  
Energy Width ◽  
Energy Filtering

The energy resolution which can be attained in electron energy loss spectroscopy (EELS) is determined by the energy spread of the electron source. The energy width of a high brightness electron gun (typically 0.4 to 0.8 eV) blurs the energy spectrum. A pre-specimen energy filter or monochromator must be used to reduce the energy width of the beam below 0.1 eV to allow detailed EELS analysis of the electronic band structures in materials. The monochromator can not only improve EELS, but it is also capable of improving the spatial resolution in low voltage SEM, which is limited by the chromatic blur of the objective lens. A new type of monochromator the Fringe Field Monochromator has been designed and experiments in an ultra high vacuum setup show the monochromatisation of a Schottky Field Emission Gun.

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