Fabrication and characterization of a dynamically flat high resolution micro-scanner

2008 ◽  
Vol 10 (4) ◽  
pp. 044005 ◽  
Author(s):  
S Hsu ◽  
T Klose ◽  
C Drabe ◽  
H Schenk
Keyword(s):  
High Resolution ◽  
Fabrication And Characterization

scholarly journals Electron beam fabrication and characterization of high‐resolution magnetic force microscopy tips

1996 ◽  
Vol 79 (6) ◽  
pp. 2913-2919 ◽  
Author(s):  
M. Rührig ◽  
S. Porthun ◽  
J. C. Lodder ◽  
S. McVitie ◽  
L. J. Heyderman ◽  
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Electron Beam ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Fabrication And Characterization

Fabrication and characterization of high-resolution AFM tips with high-quality double-wall carbon nanotubes

2006 ◽  
Vol 429 (4-6) ◽  
pp. 581-585 ◽  
Author(s):  
Shota Kuwahara ◽  
Seiji Akita ◽  
Masashi Shirakihara ◽  
Toshiki Sugai ◽  
Yoshikazu Nakayama ◽  
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Keyword(s):  
Carbon Nanotubes ◽  
High Resolution ◽  
High Quality ◽  
Afm Tips ◽  
Fabrication And Characterization ◽  
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scholarly journals Fabrication and Characterization of Dual Function Nanoscale pH-Scanning Ion Conductance Microscopy (SICM) Probes for High Resolution pH Mapping

2013 ◽  
Vol 85 (17) ◽  
pp. 8070-8074 ◽  
Author(s):  
Binoy Paulose Nadappuram ◽  
Kim McKelvey ◽  
Rehab Al Botros ◽  
Alex W. Colburn ◽  
Patrick R. Unwin
Keyword(s):  
High Resolution ◽  
Dual Function ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy ◽  
Fabrication And Characterization

scholarly journals Fabrication and characterization of ultra-high resolution multilayer-coated blazed gratings

2011 ◽  
Vol 649 (1) ◽  
pp. 156-159 ◽  
Author(s):  
Dmitriy L. Voronov ◽  
Erik H. Anderson ◽  
Rossana Cambie ◽  
Scott Dhuey ◽  
Eric M. Gullikson ◽  
...  
Keyword(s):  
High Resolution ◽  
Fabrication And Characterization
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