scholarly journals Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope

2010 ◽  
Vol 241 ◽  
pp. 012012 ◽  
Author(s):  
P Wang ◽  
G Behan ◽  
A I Kirkland ◽  
P D Nellist
2009 ◽  
Vol 15 (S2) ◽  
pp. 42-43 ◽  
Author(s):  
P Wang ◽  
G Behan ◽  
AI Kirkland ◽  
P Nellist

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009


2012 ◽  
Vol 18 (S2) ◽  
pp. 532-533
Author(s):  
P. Wang ◽  
A.I. Kirkland ◽  
P.D. Nellist ◽  
A.J. D’Alfonso ◽  
A.J. Morgan ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.


2014 ◽  
Vol 20 (S3) ◽  
pp. 376-377
Author(s):  
Peng Wang ◽  
Angus I. Kirkland ◽  
Peter D. Nellist ◽  
Adrian J. D’Alfonso ◽  
Andrew J. Morgan ◽  
...  

2011 ◽  
Vol 111 (7) ◽  
pp. 877-886 ◽  
Author(s):  
Peng Wang ◽  
Gavin Behan ◽  
Angus I. Kirkland ◽  
Peter D. Nellist ◽  
Eireann C. Cosgriff ◽  
...  

Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.


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