EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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417

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Published By Springer Berlin Heidelberg

9783540851547, 9783540851561

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Precession Electron Diffraction for the characterization of twinning in pseudo-symmetrical crystals: case of coesite

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_97 ◽

2009 ◽

pp. 193-194

Author(s):

D. Jacob ◽

P. Cordier ◽

J. P. Morniroli ◽

H. P. Schertl

Keyword(s):

Electron Diffraction ◽

Precession Electron Diffraction

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Atomic-resolution studies of In2O3-ZnO compounds on aberration-corrected electron microscopes

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_85 ◽

2009 ◽

pp. 169-170

Author(s):

Wentao Yu ◽

Lothar Houben ◽

Karsten Tillmann ◽

Werner Mader

Keyword(s):

Atomic Resolution ◽

Electron Microscopes ◽

Aberration Corrected

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Three-dimensional HREM Structure Retrieval

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_75 ◽

2009 ◽

pp. 149-150

Author(s):

Z. Saghi ◽

X. Xu ◽

G. Möbus

Keyword(s):

Three Dimensional

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New Approach to Quantitative ADF STEM

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_65 ◽

2009 ◽

pp. 129-130

Author(s):

J. M. LeBeau ◽

S. D. Findlay ◽

L. J. Allen ◽

S. Stemmer

Keyword(s):

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PPA: An Improved Implementation of Peak Pairs procedure as a DM plug-in for Strain Mapping

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_63 ◽

2009 ◽

pp. 125-126

Author(s):

K. Ishizuka ◽

P. Galindo ◽

J. Pizarro ◽

S. I. Molina

Keyword(s):

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Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_62 ◽

2009 ◽

pp. 123-124

Author(s):

F. Hüe ◽

F. Houdellier ◽

E. Snoeck ◽

V. Destefanis ◽

J. M. Hartmann ◽

...

Keyword(s):

Electronic Devices ◽

Strain Measurements ◽

Aberration Corrected

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A Newly Developed 64 MegaPixel camera for Transmission Electron Microscopy

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_44 ◽

2009 ◽

pp. 87-88

Author(s):

H. R. Tietz

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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Serial-section Polishing Tomography

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_410 ◽

2009 ◽

pp. 819-820 ◽

Author(s):

J. A. Hunt ◽

P. Prasad ◽

E. Raz

Keyword(s):

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Optimal Imaging Parameters in Cs-Corrected Transmission Electron Microscopy with a Physical Phase Plate

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_41 ◽

2009 ◽

pp. 81-82

Author(s):

B. Gamm ◽

K. Schultheiss ◽

D. Gerthsen ◽

R. R. Schröder

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Plate ◽

Imaging Parameters ◽

Transmission Electron ◽

Optimal Imaging

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Lipid nanotube encapsulating method in low voltage scanning transmission electron microscopy

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85156-1_407 ◽

2009 ◽

pp. 813-814

Author(s):

H. Furusho ◽

Y. Mishima ◽

N. Kameta ◽

M. Yamane ◽

M. Masuda ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Low Voltage ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Lipid Nanotube ◽

Voltage Scanning

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