EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
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9783540851547, 9783540851561
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Elemental distribution profiles across Cu(In,Ga)Se2 solar-cell absorbers acquired by various techniques

2009 ◽  
pp. 741-742 ◽  
Author(s):  
D. Abou-Ras ◽  
C. A. Kaufmann ◽  
A. Schöpke ◽  
A. Eicke ◽  
M. Döbeli ◽  
...  
Keyword(s):  
Solar Cell ◽  
Elemental Distribution

Using a monochromator to improve the resolution in focal-series reconstructed TEM down to 0.5Å

2009 ◽  
pp. 53-54 ◽  
Author(s):  
P. C. Tiemeijer ◽  
M. Bischoff ◽  
B. Freitag ◽  
C. Kisielowski

Structural Investigation of a Layered Carbon Nitride Polymer by Electron Diffraction

2009 ◽  
pp. 185-186
Author(s):  
M. Döblinger ◽  
B. V. Lotsch ◽  
L. Seyfarth ◽  
J. Senker ◽  
W. Schnick
Keyword(s):  
Electron Diffraction ◽  
Carbon Nitride ◽  
Structural Investigation

Atomic-resolution studies of In2O3-ZnO compounds on aberration-corrected electron microscopes

2009 ◽  
pp. 169-170
Author(s):  
Wentao Yu ◽  
Lothar Houben ◽  
Karsten Tillmann ◽  
Werner Mader
Keyword(s):  
Atomic Resolution ◽  
Electron Microscopes ◽  
Aberration Corrected

Three-dimensional HREM Structure Retrieval

2009 ◽  
pp. 149-150
Author(s):  
Z. Saghi ◽  
X. Xu ◽  
G. Möbus
Keyword(s):  
Three Dimensional

New Approach to Quantitative ADF STEM

2009 ◽  
pp. 129-130
Author(s):  
J. M. LeBeau ◽  
S. D. Findlay ◽  
L. J. Allen ◽  
S. Stemmer
Keyword(s):  
New Approach

PPA: An Improved Implementation of Peak Pairs procedure as a DM plug-in for Strain Mapping

2009 ◽  
pp. 125-126
Author(s):  
K. Ishizuka ◽  
P. Galindo ◽  
J. Pizarro ◽  
S. I. Molina
Keyword(s):  
Strain Mapping

Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography

2009 ◽  
pp. 123-124
Author(s):  
F. Hüe ◽  
F. Houdellier ◽  
E. Snoeck ◽  
V. Destefanis ◽  
J. M. Hartmann ◽  
...  
Keyword(s):  
Electronic Devices ◽  
Dark Field ◽  
Strain Measurements ◽  
Aberration Corrected
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