Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

A project for on-line remote control of a high-voltage TEM

1995 ◽  
Vol 53 ◽  
pp. 82-83 ◽  
Author(s):  
B. Parvin ◽  
D. Agarwal ◽  
D. Owen ◽  
M.A. O'Keefe ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Imaging System ◽  
Remote Access ◽  
Video Signals ◽  
Transmission Electron ◽  
Control Computer ◽  
On Line

On-line microscopy commenced with demonstrations for biological and SEM applications. For materials science, a project has recently been established to provide users of the NCEM with remote online access to a 1.5MeV Kratos EM-1500 high-voltage transmission electron microscope via existing wide area networks. Within this project we are developing and implementing a set of tools, protocols, and interfaces to bring transmission electron microscopy on-line for collaborative research. Initially applied to the Kratos, the project will provide increased utilization of this unique instrument with its heretofore restricted access due to its sensitive components and demand for sophisticated operator skills. Additionally, the project will provide computer tools for capturing and manipulating real-time audio and video signals. These tools will be integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.Dynamic study of a specimen in an electron microscope requires continuous adjustment of specimen position and orientation under the beam, illumination conditions, focus adjustments, and corrections for aberrations, all based upon the video signal coming from the imaging system.

Materials Science in the Electron Microscope

MRS Bulletin ◽  
1994 ◽  
Vol 19 (6) ◽  
pp. 17-21 ◽  
Author(s):  
Frances M. Ross
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Real Time ◽  
Materials Science ◽  
Foil Thickness ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Dynamic Experiments ◽  
Electron Microscopes

This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage electron microscopy (HVEM).The idea of carrying out dynamic experiments involving real-time observation of microscopic phenomena has always had an attraction for materials scientists. Ever since the first static images were obtained in the electron microscope, materials scientists have been interested in observing processes in real time: we feel that we obtain a true understanding of a microscopic phenomenon if we can actually watch it taking place. The idea behind “materials science in the electron microscope” is therefore to use the electron microscope—with its unique ability to image subtle changes in a material at or near the atomic level—as a laboratory in which a remarkable variety of experiments can be carried out. In this issue you will read about dynamic experiments in areas such as phase transformations, thin-film growth, and electromigration, which make use of innovative designs for the specimen, the specimen holder, or the microscope itself. These articles speak for themselves in demonstrating the power of real-time analysis in the quantitative exploration of reaction mechanisms.The first transmission electron microscopes operated at low accelerating voltages, up to about 100 kV. This placed a severe limitation on the thickness of foils that could be examined: Heavy elements, for example, had to be made into foils thinner than 0.1 μm. It was felt that any phenomenon whose “mean free path” was comparable to the foil thickness would be significantly affected by the foil surfaces, and therefore would be unsuitable for study in situ. However, technology quickly generated ever higher accelerating voltages, culminating in the giant 3 MeV electron microscopes. At these voltages, electrons can penetrate materials as thick as 6–9 μm for light elements such as Si and Al, and 1 μm for very heavy ones such as Au and U.

scholarly journals Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes

2020 ◽  
Vol 68 (6) ◽  
pp. 389-402
Author(s):  
Lars Möller ◽  
Gudrun Holland ◽  
Michael Laue
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
High Voltage ◽  
Low Voltage ◽  
Optical Resolution ◽  
Plant Diseases ◽  
Voltage Electron ◽  
Transmission Electron ◽  
High Voltage Transmission ◽  
Electron Microscopes

Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.

Instrumentation and Computation

1990 ◽  
Vol 48 (1) ◽  
pp. 2-3
Author(s):  
P.B. Hirsch
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Materials Science ◽  
Image Interpretation ◽  
Specimen Preparation ◽  
Scanning Tunnelling Microscope ◽  
Transmission Electron ◽  
Wide Range ◽  
Electron Microscopes ◽  
Types Of Information

The benefit to society arising from developments in instrumentation and computation can be judged primarily by the advances in knowledge and understanding generated by their application in different branches of science, covered in the other papers in this symposium. Without advances in instrumentation none of these advances is possible; developments in instrumentation and in image interpretation are therefore fundamental to and precede scientific advances in fields in which knowledge of structure is important. There is little doubt that the revolutionary first step was the development of the transmission electron microscope (TEM) in 1931 by Ernst Ruska; a second was the development of the scanning electron microscope (SEM); and the third the introduction of the scanning tunnelling microscope (STM) for high resolution surface imaging, by Binnig and Rohrer.The TEM and SEM have undergone continuous developments over the last 50 years or so, and have had a far-reaching impact in a wide range of disciplines; the STM is a relative newcomer but no doubt it too will have an increasing impact in furthering our understanding of solids and surfaces in particular. Once the basic instruments became available subsequent developments have been driven by the demands of the scientific disciplines in which these instruments have been applied. Many of the new developments in instrumentation and interpretation have been pioneered by the users themselves, and these in turn have led to modifications in commercial instruments to make such advances in technique available to the user community as a whole. Other developments have been initiated directly by the manufacturers as a result of a perceived need. There has been and continues to be a close interaction between the developers of hardware (not only of electron microscopes but also of ancillary equipment, e.g. microanalysis attachments, image processing equipment, specialist specimen stages, and specimen preparation facilities) and the users, leading to extensions in the range of applications and the types of information which can be obtained by electron microscopy. The following examples from the developments of electron microscopy in Materials Science illustrate these interactions and the particular advances arising from specific developments:

Elemental Mapping by Energy-Filtered Electron Microscopy

1994 ◽  
Vol 332 ◽  
Author(s):  
Ondrej L. Krivanek ◽  
Michael K. Kundmann ◽  
Xavier Bourrat
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Materials Science ◽  
Elemental Mapping ◽  
Quantitative Technique ◽  
Transmission Electron ◽  
Distribution Of Elements

ABSTRACTEnergy-filtered imaging in a transmission electron microscope provides a fast and quantitative technique for mapping the distribution of elements in solids at nm-level resolution. The technique and its instrumental requirements are reviewed, and illustrated in the context of materials science.

In-Situ Transmission Electron Microscopy of the Etching of Silicon (111) Surfaces by Oxygen

1991 ◽  
Vol 238 ◽  
Author(s):  
J. M. Gibson ◽  
F. M. Ross
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Oxide Layer ◽  
Transmission Electron Microscope ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Surface Steps ◽  
Transmission Electron

ABSTRACTSilicon (111) surfaces have been etched in-situ in a ultra-high vacuum transmission electron microscope. Surface steps are observed to flow during etching, so that Si atoms are removed only from steps. This is in contrast to the behavior during the formation of an oxide layer reported previously. The nucleation of steps and their interaction with surface impurities is described.

scholarly journals Sub-Ångstrom Low-Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope

2010 ◽  
Vol 16 (4) ◽  
pp. 386-392 ◽  
Author(s):  
David C. Bell ◽  
Christopher J. Russo ◽  
Gerd Benner
Keyword(s):  
Electron Microscope ◽  
Electron Energy ◽  
Transmission Electron Microscope ◽  
Cross Sections ◽  
Materials Science ◽  
Low Voltage ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Voltage Performance ◽  
Aberration Corrected

AbstractLowering the electron energy in the transmission electron microscope allows for a significant improvement in contrast of light elements and reduces knock-on damage for most materials. If low-voltage electron microscopes are defined as those with accelerating voltages below 100 kV, the introduction of aberration correctors and monochromators to the electron microscope column enables Ångstrom-level resolution, which was previously reserved for higher voltage instruments. Decreasing electron energy has three important advantages: (1) knock-on damage is lower, which is critically important for sensitive materials such as graphene and carbon nanotubes; (2) cross sections for electron-energy-loss spectroscopy increase, improving signal-to-noise for chemical analysis; (3) elastic scattering cross sections increase, improving contrast in high-resolution, zero-loss images. The results presented indicate that decreasing the acceleration voltage from 200 kV to 80 kV in a monochromated, aberration-corrected microscope enhances the contrast while retaining sub-Ångstrom resolution. These improvements in low-voltage performance are expected to produce many new results and enable a wealth of new experiments in materials science.

Integrated microscopy resource for biomedical research at the university of wisconsin at madison

1987 ◽  
Vol 45 ◽  
pp. 594-597 ◽  
Author(s):  
G. Schatten ◽  
J. Pawley ◽  
H. Ris
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Biomedical Research ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
University Of Wisconsin ◽  
Transmission Electron ◽  
The University

The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.

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