Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs
2007 ◽
Vol E90-C
(5)
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pp. 968-972
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Keyword(s):
Keyword(s):
2012 ◽
Vol 43
(10)
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pp. 1427-1431
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Keyword(s):
2011 ◽
Vol 115
(13)
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pp. 5863-5867
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2015 ◽
Vol 06
(03)
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1990 ◽
Vol 33
(7)
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pp. 851-857
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