High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface
2001 ◽
Vol 50
(6)
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pp. 541-544
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2009 ◽
Vol 50
(5)
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pp. 1037-1040
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2001 ◽
Vol 493
(1-3)
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pp. 414-419
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2000 ◽
Vol 85
(8)
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pp. 1674-1677
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