In-situ high resolution transmission electron microscopy observation of silicon nanocrystal nucleation in a SiO2 bilayered matrix
1995 ◽
Vol 34
(Part 2, No. 10A)
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pp. L1260-L1262
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2012 ◽
Vol 12
(11)
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pp. 8741-8745
2001 ◽
Vol 50
(6)
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pp. 541-544
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1999 ◽
Vol 48
(4)
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pp. 317-321
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