In-situ high resolution transmission electron microscopy observation of silicon nanocrystal nucleation in a SiO2 bilayered matrix

2014 ◽  
Vol 105 (5) ◽  
pp. 053116 ◽  
Author(s):  
T. C.-J. Yang ◽  
Y. Kauffmann ◽  
L. Wu ◽  
Z. Lin ◽  
X. Jia ◽  
...  
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