scholarly journals 1. On the thickness and electrical resistance of thin liquid films

1893 ◽  
Vol 53 (321-325) ◽  
pp. 394-398 ◽  
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Electrical Resistance ◽  
Optical Method ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Electrical Method ◽  
Black Film ◽  
Black Films ◽  
The Mean

The paper gives an account of experiments made for the purpose of determining the thickness of black soap films formed of solution of varying composition. Two methods of experiment were employed: (1) an optical method, in which the mean thickness of about 50 plane black films contained in a tube was deduced from observations of interference phenomena; and (2) an electrical method, in which the thickness of a cylindrical black film was derived from a measurement of its electrical resistance. The optical method involves the assumption that the refractive index of a thin film of liquid is the same as that of a large quantity of the same liquid.

scholarly journals VII. On the thickness and electrical resistance of thin liquid films

1893 ◽  
Vol 184 ◽  
pp. 505-529 ◽  
Keyword(s):  
Refractive Index ◽  
Electrical Resistance ◽  
Royal Society ◽  
Specific Resistance ◽  
Large Mass ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
First Order ◽  
Black Films ◽  
The Mean

In a paper on the “Limiting Thickness of Liquid Films,” presented to the Royal Society in 1883, we proved that in the case of a large number of films the mean thickness of that part which was thin enough to display the black of the first order of Newton’s rings was 11·6 μ. μ. (micromillimetres). The validity of the methods employed was assured by the agreement between the results obtained. The mean thickness of a number of black films was measured optically by a method which involved the assumption that the refractive index of the substance of the film was the same as that of a large mass of the same liquid. The thickness of black films was also determined by measuring their electrical resistances, and assuming that the specific resistance was the same as that of the liquid in mass. The means of the results obtained by the two methods were 11·8 μ. μ. and 11·3 μ. μ. respectively, which were sufficiently in accord to justify the assumptions.

scholarly journals Two-layer modeling of thermally induced Bénard convection in thin liquid films: Volume of fluid approach vs thin-film model

AIP Advances ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 045317
Author(s):  
Ali Mohammadtabar ◽  
Hadi Nazaripoor ◽  
Adham Riad ◽  
Arman Hemmati ◽  
Mohtada Sadrzadeh
Keyword(s):  
Thin Film ◽  
Volume Of Fluid ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Thermally Induced ◽  
Film Model ◽  
Bénard Convection ◽  
Thin Film Model ◽  
Benard Convection

scholarly journals Equations of Nonlinear Waves in Thin Film Flows with Mass Sources and Surface Activity at the Moving Boundary

2020 ◽  
Vol 15 ◽  
Keyword(s):  
Thin Film ◽  
Surface Activity ◽  
Nonlinear Waves ◽  
Moving Boundary ◽  
Film Flow ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Mass Source ◽  
Left Hand ◽  
Film Flows

The paper deals with the derivation of governing propagation equations of nonlinear waves in thin liquid films applying to two basic cases, namely for the perfect fluid flow with a weak mass source at the bottom and for the thin film of viscid liquid flow with a mass source and surface activity at the free moving boundary. The second case is considered on the example of a condensate film flow under the low heat transfer intensity. The conditions under which the model equation has the left-hand side of a type of the Korteweg-deVries equation with slowly evolved parameters, and perturbed right-hand side have been established for the both cases. The conditions under which the solitary wave solutions are possible have been defined too.

Measuring the refractive index of thin liquid films with a spectrometer

2001 ◽  
Vol 40 (28) ◽  
pp. 5111 ◽  
Author(s):  
Vincenzo Greco ◽  
Lois Hoffer ◽  
Giuseppe Molesini
Keyword(s):  
Refractive Index ◽  
Liquid Films ◽  
Thin Liquid Films

VIII. On the electrical resistance of thin liquid films, with a revision of Newton’s table of colours

1881 ◽  
Vol 172 ◽  
pp. 447-489 ◽  
Keyword(s):  
Electric Current ◽  
Electrical Resistance ◽  
Royal Society ◽  
Soap Film ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Preliminary Note ◽  
Method Evidence ◽  
Novel Method ◽  
Made In

In a preliminary note read before the Royal Society in June, 1877, we stated the results of some observations in which an electric current was used in investigating the properties of soap films. These observations were made in the course of an enquiry (then incomplete) as to whether the resistance offered by a soap film to an electric current is inversely proportional to its thickness, and our object in undertaking this was to obtain, by a novel method, evidence as to the value of previous experiments by which various physicists had from time to time attempted “to obtain from the phenomena of capillarity, or from observations on liquid films, an indication of the magnitude of the radius of molecular attraction.” Since that date we have had but few opportunities of carrying out our research in common (as was necessary), and hence the long delay which has taken place; but we are now in a position to state the results of our later experiments, in which the method has been in several respects altered, and the apparatus considerably improved.

Optical and electrical properties of solution processable TiOx thin films for solar cell and sensor applications

2011 ◽  
Vol 1352 ◽  
Author(s):  
Jiguang Li ◽  
Lin Pu ◽  
Mool C. Gupta
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electrical Resistivity ◽  
Refractive Index ◽  
Solar Cells ◽  
Solar Cell ◽  
Electrical Properties ◽  
Thermal Annealing ◽  
Electrical Resistance ◽  
Optical And Electrical Properties

ABSTRACTRecently, few tens of nanometer thin films of TiOx have been intensively studied in applications for organic solar cells as optical spacers, environmental protection and hole blocking. In this paper we provide initial measurements of optical and electrical properties of TiOx thin films and it’s applications in solar cell and sensor devices. The TiOx material was made through hydrolysis of the precursor synthesized from titanium isopropoxide, 2-methoxyethanol, and ethanolamine. The TiOx thin films of thickness between 20 nm to 120 nm were obtained by spin coating process. The refractive index of TiOx thin films were measured using an ellipsometric technique and an optical reflection method. At room temperature, the refractive index of TiOx thin film was found to be 1.77 at a wavelength of 600 nm. The variation of refractive index under various thermal annealing conditions was also studied. The increase in refractive index with high temperature thermal annealing process was observed, allowing the opportunity to obtain refractive index values between 1.77 and 2.57 at a wavelength 600 nm. The refractive index variation is due to the TiOx phase and density changes under thermal annealing.The electrical resistance was measured by depositing a thin film of TiOx between ITO and Al electrode. The electrical resistivity of TiOx thin film was found to be 1.7×107 Ω.cm as measured by vertical transmission line method. We have also studied the variation of electrical resistivity with temperature. The temperature coefficient of electrical resistance for 60 nm TiOx thin film was demonstrated as - 6×10-3/°C. A linear temperature dependence of resistivity between the temperature values of 20 – 100 °C was observed.The TiOx thin films have been demonstrated as a low cost solution processable antireflection layer for Si solar cells. The results indicate that the TiOx layer can reduce the surface reflection of the silicon as low as commonly used vacuum deposited Si3N4 thin films.

I. On the electrical resistance of thin liquid films, with a revision of Newton’s table of colours

1881 ◽  
Vol 31 (206-211) ◽  
pp. 524-525 ◽  
Keyword(s):  
Electrical Resistance ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Molecular Attraction

The authors have made numerous measurements of the electrical resistance of cylindrical liquid films. Their object was to determine whether a thinning film gave evidence by change in its specific re­sistance of an approach to a thickness equal to twice the radius of molecular attraction, and also to devise a method of finding the amount of water which might be absorbed by or evaporated from it.

scholarly journals Fast and Accurate Thickness Mapping of Thin Liquid Films

2019 ◽  
Vol 215 ◽  
pp. 12002
Author(s):  
Zhe Wang ◽  
Vincenzo Ferraro ◽  
Biagio Mandracchia ◽  
Ernesto Di Maio ◽  
Pier Luca Maffettone ◽  
...  
Keyword(s):  
Thin Film ◽  
Life Science ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Industrial Processes ◽  
Phase Imaging ◽  
Protein Films ◽  
Quantitative Phase Imaging ◽  
Materials Engineering ◽  
Level Of Details

The thickness of thin liquid films is of great interest to industrial processes and life science. However, there are not appropriate quantitative experimental tools for an adequate study of film evolution in case of not-ideal conditions. Here, we show the application of a holographic system for the evaluation of the 3D topography and thickness of evolving protein films. We use a custom holographic microscope that combines quantitative phase imaging with materials engineering. This technique offers an unprecedented level of details and we anticipate that it will promote a deeper understanding of the underlying physics of thin film dynamics.

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