Low-energy electron-loss spectroscopy and Auger-electron-spectroscopy studies of noble-metal—silicon interfaces: Si-Au system

1982 ◽  
Vol 26 (3) ◽  
pp. 1125-1138 ◽  
Author(s):  
P. Perfetti ◽  
S. Nannarone ◽  
F. Patella ◽  
C. Quaresima ◽  
M. Capozi ◽  
...  
Keyword(s):  
Auger Electron Spectroscopy ◽  
Noble Metal ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Low Energy ◽  
Energy Electron ◽  
Electron Loss ◽  
Low Energy Electron ◽  
Spectroscopy Studies

Low energy electron microscopy and Auger electron spectroscopy studies of Cs-O activation layer on p-type GaAs photocathode

2014 ◽  
Vol 116 (17) ◽  
pp. 174509 ◽  
Author(s):  
Xiuguang Jin ◽  
Alexandre A. C. Cotta ◽  
Gong Chen ◽  
Alpha T. N`Diaye ◽  
Andreas K. Schmid ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Spectroscopy Studies ◽  
P Type
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