Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique

1986 ◽  
Vol 33 (8) ◽  
pp. 5682-5697 ◽  
Author(s):  
M. Liehr ◽  
P. A. Thiry ◽  
J. J. Pireaux ◽  
R. Caudano
1998 ◽  
Vol 327-329 ◽  
pp. 252-255 ◽  
Author(s):  
O. Pellegrino ◽  
M. Rei Vilar ◽  
G. Horowitz ◽  
F. Kouki ◽  
F. Garnier ◽  
...  

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