Direct determination of exact charge states of surface point defects using scanning tunneling microscopy: As vacancies on GaAs (110)

1996 ◽  
Vol 53 (11) ◽  
pp. 6935-6938 ◽  
Author(s):  
Kuo-Jen Chao ◽  
Arthur R. Smith ◽  
Chih-Kang Shih
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Point Defects ◽  
Direct Determination ◽  
Scanning Tunneling ◽  
Surface Point ◽  
Tunneling Microscopy ◽  
Charge States

Determination of iodine adlayer structures on Au(111) by scanning tunneling microscopy

1997 ◽  
Vol 107 (2) ◽  
pp. 585-591 ◽  
Author(s):  
Lin Huang ◽  
Peter Zeppenfeld ◽  
Sebastian Horch ◽  
George Comsa
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

scholarly journals Structural determination of the Si(111) √3×√3-Bi surface by x-ray standing waves and scanning tunneling microscopy

1994 ◽  
Vol 50 (16) ◽  
pp. 12246-12249 ◽  
Author(s):  
J. C. Woicik ◽  
G. E. Franklin ◽  
Chien Liu ◽  
R. E. Martinez ◽  
I.-S. Hwong ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Standing Waves ◽  
Scanning Tunneling ◽  
Structural Determination ◽  
Tunneling Microscopy ◽  
X Ray
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