Direct determination of surface diffusion by displacement distribution measurement with scanning tunneling microscopy

1993 ◽  
Vol 71 (18) ◽  
pp. 2923-2926 ◽  
Author(s):  
Y. W. Mo
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Diffusion ◽  
Direct Determination ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Distribution Measurement ◽  
Displacement Distribution

SCANNING TUNNELING MICROSCOPY DETERMINATION OF SURFACE DIFFUSION BY DIRECT MEASUREMENT OF DISPLACEMENT DISTRIBUTION

1994 ◽  
Vol 08 (03) ◽  
pp. 137-142
Author(s):  
Y.W. MO
Keyword(s):  
Diffusion Process ◽  
Scanning Tunneling Microscopy ◽  
Surface Diffusion ◽  
Direct Measurement ◽  
Anisotropic Diffusion ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Displacement Distribution ◽  
Microscopy Method

A scanning tunneling microscopy method for studying surface diffusion is developed based on measurements of the displacement distribution of adsorbates by “image-anneal-image” cycles which allow direct observation of diffusion process while avoiding potential STM-tip effects. The method is used to study the anisotropic diffusion of Sb dimers on Si(001).

Fast interdiffusion in thin films: Scanning-tunneling-microscopy determination of surface diffusion through microscopic pinholes

1993 ◽  
Vol 48 (4) ◽  
pp. 2855-2858 ◽  
Author(s):  
A. K. Schmid ◽  
D. Atlan ◽  
H. Itoh ◽  
B. Heinrich ◽  
T. Ichinokawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Tunneling Microscopy ◽  
Surface Diffusion ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Determination of iodine adlayer structures on Au(111) by scanning tunneling microscopy

1997 ◽  
Vol 107 (2) ◽  
pp. 585-591 ◽  
Author(s):  
Lin Huang ◽  
Peter Zeppenfeld ◽  
Sebastian Horch ◽  
George Comsa
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy
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