scholarly journals Signature of a three-dimensional photonic band gap observed on silicon inverse woodpile photonic crystals

2011 ◽  
Vol 83 (20) ◽  
Author(s):  
Simon R. Huisman ◽  
Rajesh V. Nair ◽  
Léon A. Woldering ◽  
Merel D. Leistikow ◽  
Allard P. Mosk ◽  
...  
2003 ◽  
Vol 18 (9) ◽  
pp. 2214-2220 ◽  
Author(s):  
Shingo Kanehira ◽  
Soshu Kirihara ◽  
Yoshinari Miyamoto ◽  
Kazuaki Sakoda ◽  
Mitsuo Wada Takeda

Three-dimensional photonic crystals with a diamond structure, which are composed of the TiO2-based ceramic particles dispersed in an epoxy lattice, were fabricated by stereolithography. The diamond structure showed a photonic band gap in the 14.3–17.0 GHz range along the Γ-K 〈110〉 direction, which is close to the band calculation using the plain wave expansion method. Two types of lattice defects—air cavity and dielectric cavity—were introduced into the diamond structure by removing a unit cell of diamond structure or inserting a block of the lattice medium into the air cavity. The transmission of millimeter waves affected by multiple reflections at the defects was measured in the photonic band gap. Resonant frequencies in the defects were calculated and compared with the measurement results.


2010 ◽  
Vol 27 (7) ◽  
pp. 074205 ◽  
Author(s):  
Liu Yan-Ping ◽  
Yan Zhi-Jun ◽  
Li Zhi-Gang ◽  
Li Qin-Tao ◽  
Wang Yin-Yue

2007 ◽  
Vol 21 (16) ◽  
pp. 2761-2768 ◽  
Author(s):  
XIYING MA ◽  
ZHIJUN YAN

The size influence of silica microspheres on the photonic band gap (PBG) of three-dimensional face-centered-cubic (fcc) photonic crystals (PCs) is studied by means of colloidal photonic crystals, which are self-assembled by the vertical deposition technique. Monodispersed SiO 2 microspheres with a diameter of 220–320 nm are synthesized using tetraethylorthosilicate (TEOS) as a precursor material. We find that the PBG of the PCs shifts from 450 nm to 680 nm with silica spheres increasing from 220 to 320 nm. In addition, the PBG moves to higher photon energy when the samples are annealed in a temperature range of 200–700°C. The large shift results from the decrease in refraction index of silica due to moisture evaporation.


2010 ◽  
Vol 44 (12) ◽  
pp. 1537-1542 ◽  
Author(s):  
A. B. Pevtsov ◽  
S. A. Grudinkin ◽  
A. N. Poddubny ◽  
S. F. Kaplan ◽  
D. A. Kurdyukov ◽  
...  

2000 ◽  
Vol 77 (26) ◽  
pp. 4256-4258 ◽  
Author(s):  
M. Notomi ◽  
T. Tamamura ◽  
T. Kawashima ◽  
S. Kawakami

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