Fundamental Resolution of Difficulties in the Theory of Charged Point Defects in Semiconductors
Yu-Ning Wu
◽
X.-G. Zhang
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Sokrates T. Pantelides
Hui-Xiong Deng
◽
Su-Huai Wei
Michael Toriyama
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Madison Brod
◽
G Jeffrey Snyder
Wei Chen
◽
Alfredo Pasquarello
2006 ◽
Vol 55
(3-6)
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pp. 57-149
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Edmund G. Seebauer
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Meredith C. Kratzer
James A. Van Vechten
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John F. Wager
1998 ◽
Vol 58
(3)
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pp. 1318-1325
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M. J. Puska
◽
S. Pöykkö
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M. Pesola
◽
R. M. Nieminen
2000 ◽
Vol 113
(23)
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pp. 10744-10752
◽
Davide Erbetta
◽
Davide Ricci
◽
Gianfranco Pacchioni
2010 ◽
Vol 248
(6)
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pp. 1337-1346
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2010 ◽
Vol 133
(11)
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pp. 114111
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N. D. M. Hine
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P. D. Haynes
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A. A. Mostofi
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M. C. Payne