scholarly journals Chemical Interpretation of Charged Point Defects in Semiconductors: A Case Study of Mg2Si

Author(s):  
Michael Toriyama ◽  
Madison Brod ◽  
G Jeffrey Snyder
2006 ◽  
Vol 55 (3-6) ◽  
pp. 57-149 ◽  
Author(s):  
Edmund G. Seebauer ◽  
Meredith C. Kratzer

1998 ◽  
Vol 58 (3) ◽  
pp. 1318-1325 ◽  
Author(s):  
M. J. Puska ◽  
S. Pöykkö ◽  
M. Pesola ◽  
R. M. Nieminen

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