Chemical Interpretation of Charged Point Defects in Semiconductors: A Case Study of Mg2Si
Michael Toriyama
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Madison Brod
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G Jeffrey Snyder
Hui-Xiong Deng
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Su-Huai Wei
Wei Chen
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Alfredo Pasquarello
Yu-Ning Wu
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X.-G. Zhang
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Sokrates T. Pantelides
2006 ◽
Vol 55
(3-6)
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pp. 57-149
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Edmund G. Seebauer
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Meredith C. Kratzer
James A. Van Vechten
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John F. Wager
1998 ◽
Vol 58
(3)
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pp. 1318-1325
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M. J. Puska
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S. Pöykkö
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M. Pesola
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R. M. Nieminen
2017 ◽
Vol 29
(45)
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pp. 455901
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Jinghua Liang
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Huijun Liu
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Dengdong Fan
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Peiheng Jiang
2000 ◽
Vol 113
(23)
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pp. 10744-10752
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Davide Erbetta
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Davide Ricci
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Gianfranco Pacchioni
2010 ◽
Vol 248
(6)
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pp. 1337-1346
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