Simplified embedding schemes for the quantum-chemical description of neutral and charged point defects in SiO2 and related dielectrics

2000 ◽  
Vol 113 (23) ◽  
pp. 10744-10752 ◽  
Author(s):  
Davide Erbetta ◽  
Davide Ricci ◽  
Gianfranco Pacchioni
2012 ◽  
Vol 137 (17) ◽  
pp. 174708 ◽  
Author(s):  
T. Van Regemorter ◽  
M. Guillaume ◽  
A. Fuchs ◽  
C. Lennartz ◽  
V. Geskin ◽  
...  

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