Simplified embedding schemes for the quantum-chemical description of neutral and charged point defects in SiO2 and related dielectrics
2000 ◽
Vol 113
(23)
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pp. 10744-10752
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2009 ◽
Vol 45
(6)
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pp. 680-684
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2012 ◽
Vol 137
(17)
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pp. 174708
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2010 ◽
Vol 133
(11)
◽
pp. 114111
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Keyword(s):
2015 ◽
Vol 36
(30)
◽
pp. 2246-2259
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2017 ◽
Vol 474
(2)
◽
pp. 89-92
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Keyword(s):
Keyword(s):