Element Specific Magnetization of Buried Interfaces Probed by Diffuse X-Ray Resonant Magnetic Scattering

1996 ◽  
Vol 77 (18) ◽  
pp. 3925-3928 ◽  
Author(s):  
J. F. MacKay ◽  
C. Teichert ◽  
D. E. Savage ◽  
M. G. Lagally
2021 ◽  
Vol 15 (8) ◽  
pp. 2170029
Author(s):  
Radu Abrudan ◽  
Martin Hennecke ◽  
Florin Radu ◽  
Torsten Kachel ◽  
Karsten Holldack ◽  
...  
Keyword(s):  

Author(s):  
Hina Verma ◽  
Karine Le Guen ◽  
Renaud Delaunay ◽  
Iyas Ismail ◽  
Vita Ilakovac ◽  
...  

2017 ◽  
Vol 95 (20) ◽  
Author(s):  
M. Ramakrishnan ◽  
Y. Joly ◽  
Y. W. Windsor ◽  
L. Rettig ◽  
A. Alberca ◽  
...  

2015 ◽  
Vol 48 (3) ◽  
pp. 786-796 ◽  
Author(s):  
Maheswar Nayak ◽  
P. C. Pradhan ◽  
G. S. Lodha

Element-specific structural analysis at the buried interface of a low electron density contrast system is important in many applied fields. The analysis of nanoscaled Si/B4C buried interfaces is demonstrated using resonant X-ray reflectivity. This technique combines information about spatial modulations of charges provided by scattering, which is further enhanced near the resonance, with the sensitivity to electronic structure provided by spectroscopy. Si/B4C thin-film structures are studied by varying the position of B4C in Si layers. Measured values of near-edge optical properties are correlated with the resonant reflectivity profile to quantify the element-specific composition. It is observed that, although Si/B4C forms a smooth interface, there are chemical changes in the sputtered B4C layer. Nondestructive quantification of the chemical changes and the spatial distribution of the constituents is reported.


2012 ◽  
Vol 208 (1) ◽  
pp. 157-164 ◽  
Author(s):  
M. G. Kim ◽  
A. Kreyssig ◽  
Y. B. Lee ◽  
R. J. McQueeney ◽  
B. N. Harmon ◽  
...  
Keyword(s):  

2008 ◽  
Vol 15 (6) ◽  
pp. 600-605 ◽  
Author(s):  
Michael Paulus ◽  
Daniela Lietz ◽  
Christian Sternemann ◽  
Kaveh Shokuie ◽  
Florian Evers ◽  
...  
Keyword(s):  
X Ray ◽  

2012 ◽  
Vol 1 (1) ◽  
pp. 5-15 ◽  
Author(s):  
Peter Fischer ◽  
Charles S. Fadley

AbstractThe magnetic properties of matter continue to be a vibrant research area driven both by scientific curiosity to unravel the basic physical processes which govern magnetism and the vast and diverse utilization of magnetic materials in current and future devices, e.g., in information and sensor technologies. Relevant length and time scales approach fundamental limits of magnetism and with state-of-the-art synthesis approaches we are able to create and tailor unprecedented properties. Novel analytical tools are required to match these advances and soft X-ray probes are among the most promising ones. Strong and element-specific magnetic X-ray dichroism effects as well as the nanometer wavelength of photons and the availability of fsec short and intense X-ray pulses at upcoming X-ray sources enable unique experimental opportunities for the study of magnetic behavior. This article provides an overview of recent achievements and future perspectives in magnetic soft X-ray spectromicroscopies which permit us to gain spatially resolved insight into the ultrafast spin dynamics and the magnetic properties of buried interfaces of advanced magnetic nanostructures.


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