Dimensions de micelles mixtes de p-alkylbenzènesulfonates par diffusion central des rayons X

1977 ◽  
Vol 10 (1) ◽  
pp. 37-44 ◽  
Author(s):  
C. Cabos ◽  
P. Delord ◽  
J. Rouviere
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
Micellar Solutions ◽  
Probable Structure ◽  
X Ray ◽  
Absolute Scale ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Two Component ◽  
Most Probable Structure

The structure of micellar solutions is determined from X-ray small-angle scattering measurements on an absolute scale. The most probable structure is chosen by comparison with spherical cylindrical and lamellar models. This method is applied to two-component micelles and it is possible to follow the variation of micellar dimensions when the concentration of each component is varying.

Performance and First Results of the ELETTRA High-Flux Beamline for Small-Angle X-ray Scattering

1997 ◽  
Vol 30 (5) ◽  
pp. 872-876 ◽  
Author(s):  
H. Amenitsch ◽  
S. Bernstorff ◽  
M. Kriechbaum ◽  
D. Lombardo ◽  
H. Mio ◽  
...  
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
Design Parameters ◽  
High Flux ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

A new beamline for small-angle X-ray scattering (SAXS) has recently been constructed and is presently under final commissioning at the 2 GeV storage ring ELETTRA. It has been designed specifically for time-resolved studies of non-crystalline and fibrous materials and has been optimized for small-angle scattering measurements. The beamline operates with a SAXS resolution between 10 and about 1400 Å in d spacing (at 8 keV) and has been optimized with respect to high flux at the sample [of the order of 1013 photons s−1 for 8 keV photons (2 GeV, 400 mA)]. Soon it will be possible to perform simultaneously wide-angle diffraction measurements in the d-spacing range 1.2–8 Å (at 8 keV). In order to allow time-resolved (resolution ~1 ms) small-angle scattering measurements, a high-power 57-pole wiggler is used as the beamline source. From its beam, one of three discrete energies, 5.4, 8 and 16 keV, can be selected with a double-crystal monochromator, which contains three pairs of asymmetrically cut plane Si(111) crystals. Downstream, the beam is focused horizontally and vertically by a toroidal mirror. Commissioning tests of this new SAXS beamline showed that all design parameters have been realized.

scholarly journals Structural Analysis of DDS Nanocarriers by Neutron and X-ray Small-angle Scattering Measurements

hamon ◽  
2020 ◽  
Vol 30 (2) ◽  
pp. 102-105
Author(s):  
Tomoki Nishimura ◽  
Kazunari Akiyoshi ◽  
Yurina Sekine
Keyword(s):  
Structural Analysis ◽  
Small Angle ◽  
Small Angle Scattering ◽  
X Ray ◽  
Angle Scattering ◽  
Scattering Measurements

scholarly journals A small-angle scattering environment for in situ ultrasound studies

Soft Matter ◽  
2018 ◽  
Vol 14 (25) ◽  
pp. 5283-5293 ◽  
Author(s):  
David S. Li ◽  
Yi-Ting Lee ◽  
Yuyin Xi ◽  
Ivan Pelivanov ◽  
Matthew O’Donnell ◽  
...  
Keyword(s):  
Neutron Scattering ◽  
Small Angle ◽  
Small Angle Scattering ◽  
Ultrasound Studies ◽  
X Ray ◽  
Angle Scattering ◽  
Scattering Measurements ◽  
Sample Environment

We designed and tested a calibrated ultrasound sample environment for in situ small-angle X-ray and neutron scattering measurements.

Neutron and X-ray small-angle scattering with Fe-based metallic glasses

1988 ◽  
Vol 97 ◽  
pp. 227-230 ◽  
Author(s):  
P. Lamparter ◽  
S. Steeb ◽  
D.M. Kroeger ◽  
S. Spooner
Keyword(s):  
Metallic Glasses ◽  
Small Angle ◽  
Small Angle Scattering ◽  
X Ray ◽  
Angle Scattering

Evidence of polyion hydration from X-ray and neutron small-angle scattering experiments

1981 ◽  
Vol 4 (4) ◽  
pp. 225-231 ◽  
Author(s):  
J. Pleštil ◽  
J. Mikeš ◽  
K. Dušek ◽  
Ju. M. Ostanevich ◽  
A. B. Kunchenko
Keyword(s):  
Small Angle ◽  
Small Angle Scattering ◽  
X Ray ◽  
Angle Scattering ◽  
Neutron Small Angle Scattering

X‐ray small‐angle scattering analysis of porous silicon layers

1989 ◽  
Vol 66 (2) ◽  
pp. 625-628 ◽  
Author(s):  
P. Goudeau ◽  
A. Naudon ◽  
G. Bomchil ◽  
R. Herino
Keyword(s):  
Porous Silicon ◽  
Small Angle ◽  
Small Angle Scattering ◽  
X Ray ◽  
Angle Scattering

Information retrieval from X-ray small-angle scattering with polychromatic (`white') synchrotron radiation

1983 ◽  
Vol 16 (1) ◽  
pp. 42-46 ◽  
Author(s):  
O. Glatter ◽  
P. Laggner
Keyword(s):  
Synchrotron Radiation ◽  
Small Angle ◽  
Particle Shape ◽  
Structural Information ◽  
Small Angle Scattering ◽  
Radius Of Gyration ◽  
X Ray ◽  
Angle Scattering ◽  
Slit Length ◽  
Hinge Bending

The possibilities of obtaining structural information from X-ray small-angle scattering experiments with `white' polychromatic synchrotron radiation using line collimation are investigated by numerical simulation. Theoretical scattering curves of geometrical models were smeared with the appropriate wavelength distributions and slit-length functions, afflicted by statistical noise, and then evaluated by identical methods as normally used for experimental data, as described previously [program ITP; Glatter (1977). J. Appl. Cryst. 10, 415–421]. It is shown that even for a wavelength distribution of 50% half width, the information content is not limited to the parameters derived from the central part of the scattering curves, i.e. the radius of gyration and the zero-angle intensity, but also allows qualitative information on particle shape via the distance distribution function p(r). By a `hinge-bending model' consisting of two cylinders linked together at different angles it is demonstrated that changes in the radius of gyration amounting to less than 5% can be detected and quantified, and the qualitative changes in particle shape be reproduced.

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