An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors

1983 ◽  
Vol 16 (5) ◽  
pp. 473-478 ◽  
Author(s):  
T. P. Russell
Keyword(s):  
Small Angle ◽  
Absolute Intensity ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Ray Scattering

scholarly journals NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering

2017 ◽  
Vol 50 (2) ◽  
pp. 462-474 ◽  
Author(s):  
Andrew J. Allen ◽  
Fan Zhang ◽  
R. Joseph Kline ◽  
William F. Guthrie ◽  
Jan Ilavsky
Keyword(s):  
Reference Material ◽  
Small Angle ◽  
Standard Reference Material ◽  
Absolute Intensity ◽  
Calibration Standard ◽  
X Ray ◽  
X Ray Scattering ◽  
Nist Standard Reference Material ◽  
Intensity Calibration ◽  
Ray Scattering

The certification of a new standard reference material for small-angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary calibration capabilities of the ultra-small-angle X-ray scattering technique. This article describes how the intensity calibration has been achieved and validated in the certifiedQrange,Q= 0.008–0.25 Å−1, together with the purpose, use and availability of the SRM. The intensity calibration afforded by this robust and stable SRM should be applicable universally to all SAXS instruments that employ a transmission measurement geometry, working with a wide range of X-ray energies or wavelengths. The validation of the SRM SAXS intensity calibration using small-angle neutron scattering (SANS) is discussed, together with the prospects for including SANS in a future renewal certification.

A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

1984 ◽  
Vol 17 (5) ◽  
pp. 337-343 ◽  
Author(s):  
O. Yoda
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Proportional Counter ◽  
Anisotropic Scattering ◽  
Photon Flux ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

A high-resolution small-angle X-ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small-angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs−1 is obtained on the sample with the rotating-anode X-ray generator operated at 40 kV–30 mA. (iv) Incident X-rays are monochromated by a bent quartz crystal, which makes the determination of the incident X-ray intensity simple and unambiguous. (v) By rotation of the position-sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.

scholarly journals Small-Angle X-Ray Scattering System with Linear Position-Sensitive Detector

1982 ◽  
Vol 29 (1) ◽  
pp. 275-278 ◽  
Author(s):  
A. R. Forouhi ◽  
B. Sleaford ◽  
V. Perez-Mendez ◽  
D. de Fontaine ◽  
J. Fodor
Keyword(s):  
Small Angle ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Scattering System ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

Ultra-High Vacuum Grazing Incidence Small Angle X-Ray Scattering Camera for in Situ Surface Analysis

1993 ◽  
Vol 37 ◽  
pp. 413-418
Author(s):  
Joanne Levine Parrill ◽  
Jerome B. Cohen ◽  
Yip-Wah Chung
Keyword(s):  
Surface Analysis ◽  
Small Angle ◽  
High Vacuum ◽  
Grazing Incidence ◽  
Ultra High Vacuum ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

AbstractAn ultra-high vacuum chamber designed for in situ grazing incidence small angle x-ray scattering (GISAXS) surface analysis is described. Unique features of this equipment are the precision rotary feedthrough for angular alignment of the sample, the sample heating design, the Be window arrangement, and the compatibility of this chamber with both a rotating anode and a synchrotron beamline. This chamber was used as part of a GISAXS camera utilizing a 18 kW Rigaku rotating anode, pin-hole collimation, and a position sensitive detector. The resolution of this camera was 0.007 A-1 with a 1.4 mm wide beamstop and CuKα

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