In order to obtain an image of the material that has scattered X rays and given a diffraction pattern, which is the aim of these studies, one must perform a three-dimensional Fourier summation. The theorem of Jean Baptiste Joseph Fourier, a French mathematician and physicist, states that a continuous, periodic function can be represented by the summation of cosine and sine terms (Fourier, 1822). Such a set of terms, described as a Fourier series, can be used in diffraction analysis because the electron density in a crystal is a periodic distribution of scattering matter formed by the regular packing of approximately identical unit cells. The Fourier series that is used provides an equation that describes the electron density in the crystal under study. Each atom contains electrons; the higher its atomic number the greater the number of electrons in its nucleus, and therefore the higher its peak in an electrondensity map.We showed in Chapter 5 how a structure factor amplitude, |F (hkl)|, the measurable quantity in the X-ray diffraction pattern, can be determined if the arrangement of atoms in the crystal structure is known (Sommerfeld, 1921). Now we will show how we can calculate the electron density in a crystal structure if data on the structure factors, including their relative phase angles, are available. The Fourier series is described as a “synthesis” when it involves structure amplitudes and relative phases and builds up a picture of the electron density in the crystal. By contrast, a “Fourier analysis” leads to the components that make up this series. The term “relative” is used here because the phase of a Bragg reflection is described relative to that of an imaginary wave diffracted in the same direction at a chosen origin of the unit cell.
LXI. On cyanine prisms and a new method of exhibiting anomalous dispersion