OrientXplot: a program to analyse and display relative crystal orientations

2015 ◽  
Vol 48 (4) ◽  
pp. 1330-1334 ◽  
Author(s):  
Ross Angel ◽  
Sula Milani ◽  
Matteo Alvaro ◽  
Fabrizio Nestola

Orientations of single crystals are usually determined by diffraction experiments. Indexing of a diffraction pattern from one crystal leads to the determination of its `orientation matrix', which defines the orientation of its crystallographic axes relative to a set of reference axes associated with the diffractometer. Crystal orientations can also be described in terms of Euler angles, especially from electron backscattered diffraction measurements.OrientXplotis a Windows program that reads all common types of orientation matrices, as well as orientation data such as Euler angles. The program calculates and displays the relative orientations of pairs of crystals, such as twins or inclusion crystals trapped inside host crystals.OrientXplotcan manipulate (under user control) the orientation matrices to allow for ambiguities in indexing that arise from crystal symmetries. Orientation data can be displayed on a stereogram or output in numerical form for plotting in external programs.

2015 ◽  
Vol 70 (3) ◽  
pp. 191-196 ◽  
Author(s):  
Olaf Reckeweg ◽  
Francis J. DiSalvo

AbstractThe new compounds LiK[C(CN)3]2 and Li[C(CN)3]·½ (H3C)2CO were synthesized and their crystal structures were determined. Li[C(CN)3]·½ (H3C)2CO crystallizes in the orthorhombic space group Ima2 (no. 46) with the cell parameters a=794.97(14), b=1165.1(2) and c=1485.4(3) pm, while LiK[C(CN)3]2 adopts the monoclinic space group P21/c (no. 14) with the cell parameters a=1265.7(2), b=1068.0(2) and c=778.36(12) pm and the angle β=95.775(7)°. Single crystals of K[C(CN)3] were also acquired, and the crystal structure was refined more precisely than before corroborating earlier results.


2010 ◽  
Vol 16 (6) ◽  
pp. 831-841 ◽  
Author(s):  
Vipul K. Gupta ◽  
Sean R. Agnew

AbstractA simple algorithm is developed and implemented to eliminate ambiguities, in both statistical analyses of orientation data (e.g., orientation averaging) and electron backscattered diffraction (EBSD) orientation map visualization, caused by symmetrically equivalent orientations and the wrap-around or umklapp effect. Using crystal symmetry operators and the lowest Euclidian-distance criterion, the orientation of each pixel within a grain is redefined. An advantage of this approach is demonstrated for direct determination of the representative orientation of a grain within an EBSD map by mean, median, or quaternion-based averaging methods that can be further used within analyses or visualization of misorientation or geometrically necessary dislocation (GND) density. If one also considers the lattice curvature tensor, five components of the dislocation density tensor—corresponding to a part of the GND content—may be inferred. The methodology developed is illustrated using EBSD orientation data obtained from the fatigue crack-tips/wakes in aerospace aluminum alloys 2024-T351 and 7050-T7451.


2002 ◽  
Vol 56 (2) ◽  
pp. 200-204 ◽  
Author(s):  
M. P. Morales ◽  
N. O. Nuñez ◽  
R. Pozas ◽  
M. Ocaña ◽  
C. J. Serna

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