scholarly journals Determination of hard X-ray polarization from two-dimensional images

2020 ◽  
Vol 53 (6) ◽  
pp. 1559-1561
Author(s):  
Robert B. Von Dreele ◽  
Wenqian Xu

An estimate of synchrotron hard X-ray incident beam polarization is obtained by partial two-dimensional image masking followed by integration. With the correct polarization applied to each pixel in the image, the resulting one-dimensional pattern shows no discontinuities arising from the application of the mask. Minimization of the difference between the sums of the masked and unmasked powder patterns allows estimation of the polarization to ±0.001.

2013 ◽  
Vol 46 (2) ◽  
pp. 404-414 ◽  
Author(s):  
Sudeshna Paul ◽  
Alan M. Friedman ◽  
Chris Bailey-Kellogg ◽  
Bruce A. Craig

The interatomic distance distribution,P(r), is a valuable tool for evaluating the structure of a molecule in solution and represents the maximum structural information that can be derived from solution scattering data without further assumptions. Most current instrumentation for scattering experiments (typically CCD detectors) generates a finely pixelated two-dimensional image. In continuation of the standard practice with earlier one-dimensional detectors, these images are typically reduced to a one-dimensional profile of scattering intensities,I(q), by circular averaging of the two-dimensional image. Indirect Fourier transformation methods are then used to reconstructP(r) fromI(q). Substantial advantages in data analysis, however, could be achieved by directly estimating theP(r) curve from the two-dimensional images. This article describes a Bayesian framework, using a Markov chain Monte Carlo method, for estimating the parameters of the indirect transform, and thusP(r), directly from the two-dimensional images. Using simulated detector images, it is demonstrated that this method yieldsP(r) curves nearly identical to the referenceP(r). Furthermore, an approach for evaluating spatially correlated errors (such as those that arise from a detector point spread function) is evaluated. Accounting for these errors further improves the precision of theP(r) estimation. Experimental scattering data, where no ground truth referenceP(r) is available, are used to demonstrate that this method yields a scattering and detector model that more closely reflects the two-dimensional data, as judged by smaller residuals in cross-validation, thanP(r) obtained by indirect transformation of a one-dimensional profile. Finally, the method allows concurrent estimation of the beam center andDmax, the longest interatomic distance inP(r), as part of the Bayesian Markov chain Monte Carlo method, reducing experimental effort and providing a well defined protocol for these parameters while also allowing estimation of the covariance among all parameters. This method provides parameter estimates of greater precision from the experimental data. The observed improvement in precision for the traditionally problematicDmaxis particularly noticeable.


JETP Letters ◽  
2007 ◽  
Vol 85 (1) ◽  
pp. 98-100 ◽  
Author(s):  
A. V. Andreev ◽  
V. E. Asadchikov ◽  
A. V. Buzmakov ◽  
A. A. Konovko ◽  
S. V. Kuzin ◽  
...  

1989 ◽  
Vol 22 (2) ◽  
pp. 162-172 ◽  
Author(s):  
J.-L. Staudenmann ◽  
L. D. Chapman

The Borrmann effect, that is, the anomalous transmission of X-ray beams through sufficiently thick perfect crystals in Laue geometry, is a sensitive diffraction tool which has many fundamental and practical applications: the accurate alignment of any full four-circle instrument (equipped with a cradle in asymmetric design) with respect to the incident beam, measurement of the divergence of any X-ray beam, and the precise determination of the beam polarization, incident or diffracted. For these applications, it is shown that no modifications to the diffractometer are required. The measurements simply consist of measuring φ and χ rocking curves of the anomalous transmitted beam where the ω angle is used as a parameter. The analyses require the findings of the peak centroid positions, the full widths at half maximum and the rocking-curve integrated intensities. Some results are presented as illustrations of the method. These Borrmann-effect applications promise to be more helpful for diffractometers installed at synchrotrons than for in-house laboratories.


2001 ◽  
Author(s):  
Hiroyuki Shiraga ◽  
Manabu Heya ◽  
Shinsuke Fujioka ◽  
Noriaki Miyanaga ◽  
Masaaki Matsuoka ◽  
...  

2020 ◽  
Vol 53 (2) ◽  
pp. 536-539
Author(s):  
Daniel Franke ◽  
Nelly R. Hajizadeh ◽  
Dmitri I. Svergun

This article presents IMSIM, an application to simulate two-dimensional small-angle X-ray scattering patterns and, further, one-dimensional profiles from biological macromolecules in solution. IMSIM implements a statistical approach yielding two-dimensional images in TIFF, CBF or EDF format, which may be readily processed by existing data-analysis pipelines. Intensities and error estimates of one-dimensional patterns obtained from the radial average of the two-dimensional images exhibit the same statistical properties as observed with actual experimental data. With initial input on an absolute scale, [cm−1]/c[mg ml−1], the simulated data frames may also be scaled to absolute scale such that the forward scattering after subtraction of the background is proportional to the molecular weight of the solute. The effects of changes of concentration, exposure time, flux, wavelength, sample–detector distance, detector dimensions, pixel size, and the mask as well as incident beam position can be considered for the simulation. The simulated data may be used in method development, for educational purposes, and also to determine the most suitable beamline setup for a project prior to the application and use of the actual beamtime. IMSIM is available as part of the ATSAS software package (3.0.0) and is freely available for academic use (http://www.embl-hamburg.de/biosaxs/download.html).


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