scholarly journals To err is human: medication patient safety in aged care, a case study

2018 ◽  
Vol 19 (2) ◽  
pp. 126-134
Author(s):  
Julia Gilbert ◽  
Jeong-ah Kim

Purpose The purpose of this paper is to explore an identified medication error using a root cause analysis and a clinical case study. Design/methodology/approach In this paper the authors explore a medication error through the completion of a root cause analysis and case study in an aged care facility. Findings Research indicates that medication errors are highly prevalent in aged care and 40 per cent of nursing home patients are regularly receiving at least one potentially inappropriate medicine (Hamilton, 2009; Raban et al., 2014; Shehab et al., 2016). Insufficient patient information, delays in continuing medications, poor communication, the absence of an up-to-date medication chart and missed or significantly delayed doses are all linked to medication errors (Dwyer et al., 2014). Strategies to improve medication management across hospitalisation to medication administration include utilisation of a computerised medication prescription and management system, pharmacist review, direct communication of discharge medication documentation to community pharmacists and staff education and support (Dolanski et al., 2013). Originality/value Discussion of the factors impacting on medication errors within aged care facilities may explain why they are prevalent and serve as a basis for strategies to improve medication management and facilitate further research on this topic.

2020 ◽  
Vol 5 (2) ◽  
pp. 255-277
Author(s):  
Souad FILALI EL GHORFI ◽  

Medication error (ME) is a serious problem of public health. Difficulties related to the management of this error are numerous. Each stage of this process suffers from several flaws: identification, root causes analysis and improvement. This paper focuses on root cause analysis of medication error. We developed an original semi-quantitative method named “MAC-F (Méthode d’Analyse des Causes basée sur la Fiabilité globale, in French). It’s specific to the hospital context and constitutes a decision-making tool for professional of care. It based on a rigorous theoretical and conceptual framework (human reliability theory and high reliability organization theory). We used our method MAC F to analyze serious proven medication errors. They have been collected over the past six months (from January to June 2020) in Moroccan hospital. The reliability matrix shows that the overall reliability index is very low (Ω= 0,07). Moroccan hospital is therefore unreliable. The failure of the organizational system (Ω CF= 0,03) and the absence of preventive strategies (ΩIF= 0) don’t help practitioners to recover the medication errors (ΩSF= 0,23). Root cause analysis is the most critical step in managing medication errors. Our aim is to provide healthcare professionals with a decision support tool “MAC-F” that we believe will help them to prevent Medication Errors and to achieve overall reliability (reliable organization and practitioner). Our method was tested in a Belgian hospital before and Moroccan hospital recently.


2013 ◽  
Vol 29 (2) ◽  
pp. 102-108 ◽  
Author(s):  
Mary A. Dolansky ◽  
Kalina Druschel ◽  
Maura Helba ◽  
Kathleen Courtney

Author(s):  
Zhigang Song ◽  
Jochonia Nxumalo ◽  
Manuel Villalobos ◽  
Sweta Pendyala

Abstract Pin leakage continues to be on the list of top yield detractors for microelectronics devices. It is simply manifested as elevated current with one pin or several pins during pin continuity test. Although many techniques are capable to globally localize the fault of pin leakage, root cause analysis and identification for it are still very challenging with today’s advanced failure analysis tools and techniques. It is because pin leakage can be caused by any type of defect, at any layer in the device and at any process step. This paper presents a case study to demonstrate how to combine multiple techniques to accurately identify the root cause of a pin leakage issue for a device manufactured using advanced technology node. The root cause was identified as under-etch issue during P+ implantation hard mask opening for ESD protection diode, causing P+ implantation missing, which was responsible for the nearly ohmic type pin leakage.


2010 ◽  
Vol 30 (1) ◽  
pp. 62-65
Author(s):  
Naveed Ramzan ◽  
Shahid Naveed ◽  
Muhammad Rizwan ◽  
Werner Witt

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