scholarly journals TSV-Defect Modeling, Detection and Diagnosis Based on 3-D Full Wave Simulation and Parametric Measurement

IEEE Access ◽  
2018 ◽  
Vol 6 ◽  
pp. 72415-72426 ◽  
Author(s):  
Xu Fang ◽  
Yang Yu ◽  
Kangkang Xu ◽  
Xiyuan Peng
1997 ◽  
Author(s):  
Yves Peysson ◽  
Eric Sébelin ◽  
Xavier Litaudon ◽  
Didier Moreau ◽  
Jean-Claude Miellou ◽  
...  

2007 ◽  
Vol 43 (4) ◽  
pp. 1333-1336 ◽  
Author(s):  
Guido Ala ◽  
Elisa Francomano ◽  
Adele Tortorici ◽  
Elena Toscano ◽  
Fabio Viola

Author(s):  
R.J. Hawkins ◽  
N.K. Madsen ◽  
J.S. Kallman ◽  
M.D. Feit ◽  
C.C. Shang ◽  
...  
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