Deficiency in the error propagation method for sensitivity analysis of free space material characterization

2012 ◽  
Author(s):  
Raenita A. Fenner ◽  
Edward J. Rothwell
Keyword(s):  
Sensitivity Analysis ◽  
Free Space ◽  
Material Characterization ◽  
Error Propagation ◽  
Space Material

Free space material characterization of carbon nanotube thin films at sub-terahertz frequencies

2016 ◽  
Vol 30 (5) ◽  
pp. 589-598
Author(s):  
Sujitha Puthukodan ◽  
Ehsan Dadrasnia ◽  
Vinod V. K. Thalakkatukalathil ◽  
Horacio Lamela Rivera ◽  
Guillaume Ducournau ◽  
...  
Keyword(s):  
Thin Films ◽  
Carbon Nanotube ◽  
Free Space ◽  
Material Characterization ◽  
Terahertz Frequencies ◽  
Space Material

scholarly journals Effects of Curved Wavefronts on Conductor-Backed Reflection-Only Free-Space Material Characterization Techniques

2015 ◽  
Vol 2015 ◽  
pp. 1-9
Author(s):  
Raenita A. Fenner ◽  
Edward J. Rothwell
Keyword(s):  
Plane Wave ◽  
Magnetic Permeability ◽  
Free Space ◽  
Material Characterization ◽  
Plane Waves ◽  
Characterization Methods ◽  
Radar Absorbing Material ◽  
Absorbing Material ◽  
Space Material ◽  
The Impact

A true plane wave is often not physically realizable in a laboratory environment. Therefore, wavefront curvature introduces a form of systematic error into Free-space material characterization methods. Free-space material characterization is important to the determination of the electric permittivity and magnetic permeability of conductor-backed and in situ materials. This paper performs an error analysis of the impact on wavefront curvature on a Free-space method called the two-thickness method. This paper compares the extracted electric and magnetic permeability computed with a plane wave versus a line source for a low-loss dielectric and magnetic radar absorbing material. These steps are conducted for TE and TM plane waves and electric and magnetic line sources.

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