Electro-thermal-stress interaction of GaN HEMT breakdown induced by high power microwave pulses

Author(s):  
Liang Zhou ◽  
Zheng-Wei San ◽  
Liang Lin ◽  
Wen-Yan Yin
2017 ◽  
Vol 59 (3) ◽  
pp. 902-909 ◽  
Author(s):  
Liang Zhou ◽  
Zheng Wei San ◽  
Yu-Jie Hua ◽  
Liang Lin ◽  
Shuo Zhang ◽  
...  

2003 ◽  
Vol 24 (3) ◽  
pp. 174-181 ◽  
Author(s):  
Andrei G. Pakhomov ◽  
Joanne Doyle ◽  
Bruce E. Stuck ◽  
Michael R. Murphy

2009 ◽  
Vol 52 (8) ◽  
pp. 587-592 ◽  
Author(s):  
V. G. Andreev ◽  
V. A. Vdovin ◽  
K. V. Afanas’ev ◽  
A. A. Eltchaninov ◽  
A. I. Klimov

2021 ◽  
Vol 28 (6) ◽  
pp. 062307
Author(s):  
Y. Cao ◽  
J. G. Leopold ◽  
Yu. P. Bliokh ◽  
G. Leibovitch ◽  
Ya. E. Krasik

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