Distinguishing dynamic bridging faults and transition delay faults

2015 IEEE 11th International Conference on ASIC (ASICON) ◽

10.1109/asicon.2015.7516978 ◽

2015 ◽

Author(s):

Cheng-Hung Wu ◽

Saint James Lee ◽

Kuen-Jong Lee

Keyword(s):

Delay Faults ◽

Bridging Faults ◽

Transition Delay

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Test and diagnosis pattern generation for dynamic bridging faults and transition delay faults

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2016.7428102 ◽

2016 ◽

Author(s):

Cheng-Hung Wu ◽

Saint James Lee ◽

Kuen-Jong Lee

Keyword(s):

Pattern Generation ◽

Delay Faults ◽

Bridging Faults ◽

Transition Delay

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Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors

2020 23rd Euromicro Conference on Digital System Design (DSD) ◽

10.1109/dsd51259.2020.00105 ◽

2020 ◽

Author(s):

Adeboye Stephen Oyeniran ◽

Raimund Ubar ◽

Maksim Jenihhin ◽

Jaan Raik

Keyword(s):

Functional Test ◽

Delay Faults ◽

Transition Delay

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SAT-based generation of compressed skewed-load tests for transition delay faults

Microprocessors and Microsystems ◽

10.1016/j.micpro.2012.09.002 ◽

2013 ◽

Vol 37 (2) ◽

pp. 196-205 ◽

Author(s):

Roland Dobai ◽

Marcel Balaz

Keyword(s):

Delay Faults ◽

Transition Delay

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Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns

TENCON 2007 - 2007 IEEE Region 10 Conference ◽

10.1109/tencon.2007.4429067 ◽

2007 ◽

Author(s):

Hsing-Chung Liang ◽

Pao-Hsin Huang

Keyword(s):

Delay Faults ◽

Transition Delay

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Testing Transition Delay Faults in Modified Booth Multipliers

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2008.927761 ◽

2008 ◽

Vol 27 (9) ◽

pp. 1693-1697 ◽

Author(s):

Hsing-Chung Liang ◽

Pao-Hsin Huang ◽

Yan-Fei Tang

Keyword(s):

Delay Faults ◽

Transition Delay

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Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools

Journal of Electronic Testing ◽

10.1007/s10836-014-5490-4 ◽

2014 ◽

Vol 30 (6) ◽

pp. 763-780 ◽

Author(s):

Yu Zhang ◽

Bei Zhang ◽

Vishwani D. Agrawal

Keyword(s):

Fault Detection ◽

Diagnostic Test ◽

Test Generation ◽

Delay Faults ◽

Transition Delay

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Supply Voltage Noise Aware ATPG for Transition Delay Faults

25th IEEE VLSI Test Symmposium (VTS'07) ◽

10.1109/vts.2007.77 ◽

2007 ◽

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

Vinay Jayaram

Keyword(s):

Supply Voltage ◽

Delay Faults ◽

Voltage Noise ◽

Transition Delay

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Multi-Cycle Sensitizable Transition Delay Faults

24th IEEE VLSI Test Symposium ◽

10.1109/vts.2006.49 ◽

2006 ◽

Author(s):

J. Abraham ◽

U. Goel ◽

A. Kumar

Keyword(s):

Delay Faults ◽

Transition Delay

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On the Modeling of Gate Delay Faults by Means of Transition Delay Faults

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.53 ◽

2011 ◽

Author(s):

P. Bernardi ◽

M. Sonza Reorda ◽

A. Bosio ◽

P. Girard ◽

S. Pravossoudovitch

Keyword(s):

Delay Faults ◽

Transition Delay

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Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2008.2006177 ◽

2009 ◽

Vol 17 (11) ◽

pp. 1654-1659 ◽

Author(s):

D. Appello ◽

P. Bernardi ◽

M. Grosso ◽

E. Sanchez ◽

M. Sonza Reorda

Keyword(s):

Pattern Generation ◽

Delay Faults ◽

Full Scan ◽

Transition Delay

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