Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns
2013 ◽
Vol 37
(2)
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pp. 196-205
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2008 ◽
Vol 27
(9)
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pp. 1693-1697
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2014 ◽
Vol 30
(6)
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pp. 763-780
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2009 ◽
Vol 17
(11)
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pp. 1654-1659
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