Supply Voltage Noise Aware ATPG for Transition Delay Faults

25th IEEE VLSI Test Symmposium (VTS'07) ◽

10.1109/vts.2007.77 ◽

2007 ◽

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

Vinay Jayaram

Keyword(s):

Supply Voltage ◽

Delay Faults ◽

Voltage Noise ◽

Transition Delay

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Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design

2007 44th ACM/IEEE Design Automation Conference ◽

10.1109/dac.2007.375222 ◽

2007 ◽

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

Vinay Jayaram

Keyword(s):

Test Pattern ◽

Supply Voltage ◽

Pattern Generation ◽

Test Pattern Generation ◽

Voltage Noise ◽

Delay Fault ◽

Transition Delay

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Transition delay fault test pattern generation considering supply voltage noise in a SOC design

2007 44th ACM/IEEE Design Automation Conference ◽

10.1145/1278480.1278616 ◽

2007 ◽

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

Vinay Jayaram

Keyword(s):

Test Pattern ◽

Supply Voltage ◽

Pattern Generation ◽

Test Pattern Generation ◽

Voltage Noise ◽

Delay Fault ◽

Transition Delay

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Distinguishing dynamic bridging faults and transition delay faults

2015 IEEE 11th International Conference on ASIC (ASICON) ◽

10.1109/asicon.2015.7516978 ◽

2015 ◽

Author(s):

Cheng-Hung Wu ◽

Saint James Lee ◽

Kuen-Jong Lee

Keyword(s):

Delay Faults ◽

Bridging Faults ◽

Transition Delay

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Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors

2020 23rd Euromicro Conference on Digital System Design (DSD) ◽

10.1109/dsd51259.2020.00105 ◽

2020 ◽

Author(s):

Adeboye Stephen Oyeniran ◽

Raimund Ubar ◽

Maksim Jenihhin ◽

Jaan Raik

Keyword(s):

Functional Test ◽

Delay Faults ◽

Transition Delay

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SAT-based generation of compressed skewed-load tests for transition delay faults

Microprocessors and Microsystems ◽

10.1016/j.micpro.2012.09.002 ◽

2013 ◽

Vol 37 (2) ◽

pp. 196-205 ◽

Author(s):

Roland Dobai ◽

Marcel Balaz

Keyword(s):

Delay Faults ◽

Transition Delay

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Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns

TENCON 2007 - 2007 IEEE Region 10 Conference ◽

10.1109/tencon.2007.4429067 ◽

2007 ◽

Author(s):

Hsing-Chung Liang ◽

Pao-Hsin Huang

Keyword(s):

Delay Faults ◽

Transition Delay

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Testing Transition Delay Faults in Modified Booth Multipliers

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2008.927761 ◽

2008 ◽

Vol 27 (9) ◽

pp. 1693-1697 ◽

Author(s):

Hsing-Chung Liang ◽

Pao-Hsin Huang ◽

Yan-Fei Tang

Keyword(s):

Delay Faults ◽

Transition Delay

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Test and diagnosis pattern generation for dynamic bridging faults and transition delay faults

2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2016.7428102 ◽

2016 ◽

Author(s):

Cheng-Hung Wu ◽

Saint James Lee ◽

Kuen-Jong Lee

Keyword(s):

Pattern Generation ◽

Delay Faults ◽

Bridging Faults ◽

Transition Delay

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Using a pulsed supply voltage for delay faults testing of digital circuits in a digital oscillation environment

IEEE AFRICON. 6th Africon Conference in Africa, ◽

10.1109/afrcon.2002.1146804 ◽

2003 ◽

Author(s):

H.J. Vermaak ◽

H.G. Kerkhoff ◽

G.D. Jordaan

Keyword(s):

Digital Circuits ◽

Supply Voltage ◽

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Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools

Journal of Electronic Testing ◽

10.1007/s10836-014-5490-4 ◽

2014 ◽

Vol 30 (6) ◽

pp. 763-780 ◽

Author(s):

Yu Zhang ◽

Bei Zhang ◽

Vishwani D. Agrawal

Keyword(s):

Fault Detection ◽

Diagnostic Test ◽

Test Generation ◽

Delay Faults ◽

Transition Delay

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