Optimal test-set generation for parametric fault detection in switched capacitor filters
Keyword(s):
Test Set
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2006 ◽
Vol 23
(1)
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pp. 58-66
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1984 ◽
Vol 131
(3)
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pp. 103
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1985 ◽
Vol 32
(7)
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pp. 727-732
2007 ◽
Vol 54
(5)
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pp. 387-391
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1986 ◽
Vol 69
(1)
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pp. 10-17
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