Tracking a nanosize magnetic particle using a magnetic force microscope

Author(s):  
Dimitar Baronov ◽  
Sean B. Andersson ◽  
John Baillieul
1998 ◽  
Vol 37 (Part 2, No. 11A) ◽  
pp. L1343-L1345 ◽  
Author(s):  
Hitoshi Suzuki ◽  
Tsuyoshi Tanaka ◽  
Tomohito Sasaki ◽  
Noriyuki Nakamura ◽  
Tadashi Matsunaga ◽  
...  

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.


2005 ◽  
Vol 44 (4A) ◽  
pp. 2077-2080 ◽  
Author(s):  
Hiromi Kuramochi ◽  
Hiroyuki Akinaga ◽  
Yasuyuki Semba ◽  
Mihoko Kijima ◽  
Takuya Uzumaki ◽  
...  

2000 ◽  
Vol 36 (5) ◽  
pp. 2984-2986 ◽  
Author(s):  
J.F.C. Windmill ◽  
W.W. Clegg

Author(s):  
Jinyun Y. Liu ◽  
Zuobin B Wang ◽  
Dayou Y. Li

2002 ◽  
Vol 91 (10) ◽  
pp. 6887 ◽  
Author(s):  
Taras Pokhil ◽  
Dian Song ◽  
Eric Linville

Sign in / Sign up

Export Citation Format

Share Document