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Silicon Debug of Systems-on-Chips
Proceedings Design, Automation and Test in Europe
◽
10.1109/date.1998.655924
◽
2005
◽
Cited By ~ 1
Author(s):
K. van Doorselaer
◽
S. Narayanan
◽
G.J. van Rootselaar
◽
E.J. Marinissen
Keyword(s):
Silicon Debug
Download Full-text
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References
Trace Buffer Attack: Security versus observability study in post-silicon debug
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
◽
10.1109/vlsi-soc.2015.7314443
◽
2015
◽
Cited By ~ 9
Author(s):
Yuanwen Huang
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Anupam Chattopadhyay
◽
Prabhat Mishra
Keyword(s):
Silicon Debug
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How can the results of silicon debug justify the investment in design-for- debug infrastructure?
2007 IEEE International Test Conference
◽
10.1109/test.2007.4437682
◽
2007
◽
Author(s):
Bob Gottlieb
Keyword(s):
Silicon Debug
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SoC Security Versus Post-Silicon Debug Conflict
Post-Silicon Validation and Debug
◽
10.1007/978-3-319-98116-1_18
◽
2018
◽
pp. 367-384
Author(s):
Yangdi Lyu
◽
Yuanwen Huang
◽
Prabhat Mishra
Keyword(s):
Silicon Debug
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Trace Buffer-Based Silicon Debug with Lossless Compression
2011 24th Internatioal Conference on VLSI Design
◽
10.1109/vlsid.2011.31
◽
2011
◽
Cited By ~ 3
Author(s):
S Prabhakar
◽
R Sethuram
◽
M S Hsiao
Keyword(s):
Lossless Compression
◽
Silicon Debug
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Silicon Debug
Gizopoulos / Advances in ElectronicTesting - Frontiers in Electronic Testing
◽
10.1007/0-387-29409-0_3
◽
2006
◽
pp. 77-108
◽
Cited By ~ 3
Author(s):
Doug Josephson
◽
Bob Gottlieb
Keyword(s):
Silicon Debug
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BackSpace: Formal Analysis for Post-Silicon Debug
2008 Formal Methods in Computer-Aided Design
◽
10.1109/fmcad.2008.ecp.9
◽
2008
◽
Cited By ~ 38
Author(s):
Flavio M. De Paula
◽
Marcel Gort
◽
Alan J. Hu
◽
Steven J. E. Wilton
◽
Jin Yang
Keyword(s):
Formal Analysis
◽
Silicon Debug
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Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug
Microelectronics Reliability
◽
10.1016/s0026-2714(01)00171-8
◽
2001
◽
Vol 41
(9-10)
◽
pp. 1545-1549
◽
Cited By ~ 2
Author(s):
T. Lundquist
◽
E. Delenia
◽
J. Harroun
◽
E. LeRoy
◽
C.-C. Tsao
Keyword(s):
Integrated Circuits
◽
Silicon Debug
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Defect diagnosis and silicon debug: the continuing detective story [Tutorial]
Proceedings Design, Automation and Test in Europe Conference and Exhibition
◽
10.1109/date.2004.1268812
◽
2005
◽
Author(s):
D. Gizopoulos
◽
S. Venkataraman
◽
R. Aitken
Keyword(s):
Detective Story
◽
Defect Diagnosis
◽
Silicon Debug
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Query language framework for pre-silicon debug
2015 International Conference on Applied and Theoretical Computing and Communication Technology (iCATccT)
◽
10.1109/icatcct.2015.7456956
◽
2015
◽
Author(s):
Pooja Rajan Inamdar
◽
Dayanand D. Ambawade
Keyword(s):
Query Language
◽
Silicon Debug
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Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost
IEEE Transactions on Computers
◽
10.1109/tc.2018.2835462
◽
2018
◽
Vol 67
(12)
◽
pp. 1835-1839
◽
Cited By ~ 1
Author(s):
Inhyuk Choi
◽
Hyunggoy Oh
◽
Young-Woo Lee
◽
Sungho Kang
Keyword(s):
Silicon Debug
Download Full-text
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