Reliability of eWLB (Embedded Wafer Level BGA) for Automotive Radar Applications

Author(s):  
Daniel Yap ◽  
Kim Sing Wong ◽  
Luc Petit ◽  
Roberto Antonicelli ◽  
Seung Wook Yoon
Author(s):  
Christoph Wagner ◽  
Josef Bock ◽  
Maciej Wojnowski ◽  
Herbert Jager ◽  
Johannes Platz ◽  
...  

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