Structural Go/No-Go test of the TD-ADC for catastrophic faults

2016 ◽  
Author(s):  
Asser K. ElSayed ◽  
Sahar M. Hamed ◽  
Ahmed H. Madian ◽  
Hassanein H. Amer ◽  
M. B. Abdelhalim
Keyword(s):  
Catastrophic Faults

Research on the application of Mahalanobis distance in catastrophic faults detection of analog circuits

2009 ◽  
Vol 2009 (7) ◽  
pp. 41-45 ◽  
Author(s):  
Qingqiang Qin ◽  
Xiaoan Zhang ◽  
Aihua Li ◽  
Zhao Yang
Keyword(s):  
Analog Circuits ◽  
Mahalanobis Distance ◽  
Catastrophic Faults

A method for fast simulation of multiple catastrophic faults in analogue circuits

2008 ◽  
pp. n/a-n/a ◽  
Author(s):  
Michał Tadeusiewicz ◽  
Stanisław Hałgas
Keyword(s):  
Fast Simulation ◽  
Analogue Circuits ◽  
Catastrophic Faults

Recognition of catastrophic faults

2003 ◽  
Author(s):  
A. Nayak ◽  
L. Pagli ◽  
N. Santoro
Keyword(s):  
Catastrophic Faults

Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets

2010 ◽  
Author(s):  
A.D. Spyronasios ◽  
M.G. Dimopoulos ◽  
N.P. Papadopoulos ◽  
A.A. Hatzopoulos
Keyword(s):  
Integrated Circuits ◽  
Mixed Signal ◽  
Catastrophic Faults

On testing for catastrophic faults in reconfigurable arrays with arbitrary link redundancy

Integration ◽  
1996 ◽  
Vol 20 (3) ◽  
pp. 327-342 ◽  
Author(s):  
Amiya Nayak ◽  
Linda Pagli ◽  
Nicola Santoro
Keyword(s):  
Reconfigurable Arrays ◽  
Catastrophic Faults

scholarly journals Catastrophic faults in reconfigurable systolic linear arrays

1997 ◽  
Vol 75 (2) ◽  
pp. 105-123 ◽  
Author(s):  
Roberto De Prisco ◽  
Alfredo De Santis
Keyword(s):  
Linear Arrays ◽  
Catastrophic Faults

scholarly journals Oscillation-based testing method for detecting switch faults in High-Q SC biquad filters

2015 ◽  
Vol 28 (2) ◽  
pp. 223-236 ◽  
Author(s):  
Miljana Milic ◽  
Vanco Litovski
Keyword(s):  
Operational Amplifier ◽  
Special Problem ◽  
Test Point ◽  
Switched Capacitor ◽  
High Q ◽  
Switched Capacitor Circuits ◽  
Testing Method ◽  
The Right ◽  
Catastrophic Faults

Testing switched capacitor circuits is a challenge due to the diversity of the possible faults. A special problem encountered is the synthesis of the test signal that will control and make the fault-effect observable at the test point. The oscillation based method which was adopted for testing in these proceedings resolves that important issue in its nature. Here we discuss the properties of the method and the conditions to be fulfilled in order to implement it in the right way. To achieve that, we have resolved the problem of synthesis of the positive feed-back circuit and the choice of a proper model of the operational amplifier. In that way, a realistic foundation to the testing process was generated. A second order notch cell was chosen as a case-study. Fault dictionaries were developed related to the catastrophic faults of the switches used within the cell. The results reported here are a continuation of our previous work and are complimentary to some other already published.

Low cost test for catastrophic faults in CMOS operational transcondutor

2011 ◽  
Author(s):  
Mahmoud M. Fouad ◽  
Hassanein H. Amer ◽  
Ahmed H. Madian ◽  
M. B. AbdelHalim
Keyword(s):  
Low Cost ◽  
Catastrophic Faults
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