Testing switched capacitor circuits is a challenge due to the diversity of
the possible faults. A special problem encountered is the synthesis of the
test signal that will control and make the fault-effect observable at the
test point. The oscillation based method which was adopted for testing in
these proceedings resolves that important issue in its nature. Here we
discuss the properties of the method and the conditions to be fulfilled in
order to implement it in the right way. To achieve that, we have resolved the
problem of synthesis of the positive feed-back circuit and the choice of a
proper model of the operational amplifier. In that way, a realistic
foundation to the testing process was generated. A second order notch cell
was chosen as a case-study. Fault dictionaries were developed related to the
catastrophic faults of the switches used within the cell. The results
reported here are a continuation of our previous work and are complimentary
to some other already published.
Catastrophic faults in reconfigurable systolic linear arrays
