This paper presents a foreground digital calibration algorithm based on a dynamic comparator that aims to reduce comparator offset and capacitor mismatch, as well as improve the performance of the successive approximation analog-to-digital converter (SARADC). The dynamic comparator is designed with two preamplifiers and one latch to facilitate high speed, high precision, and low noise. The foreground digital calibration algorithm provides high speed with minimal area consumption. This design is implemented on a 12-bit 30 MS/s SARADC with a standard 0.13 μm Complementary Metal Oxide Semiconductor (CMOS) process. The simulation Nyquist 68.56 dB signal-to-noise-and-distortion ratio (SNDR) and 84.45 dBc spurious free dynamic range (SFDR) at 30 MS/s, differential nonlinearity (DNL) and integral nonlinearity (INL) are within 0.64 Least Significant Bits (LSB) and 1.3 LSB, respectively. The ADC achieves an effective number of bits (ENOB) of 11.08 and a figure-of-merit (FoM) of 39.45 fJ/conv.-step.
A 12-bit 30 MS/s Successive Approximation-Register Analog-to-Digital Converter with Foreground Digital Calibration Algorithm
