scholarly journals A 12-bit 30 MS/s Successive Approximation-Register Analog-to-Digital Converter with Foreground Digital Calibration Algorithm

Symmetry ◽  
2020 ◽  
Vol 12 (1) ◽  
pp. 165
Author(s):  
Shouping Li ◽  
Yang Guo ◽  
Jianjun Chen ◽  
Bin Liang
Keyword(s):  
Successive Approximation ◽  
High Speed ◽  
Low Noise ◽  
Digital Calibration ◽  
Cmos Process ◽  
Analog To Digital Converter ◽  
Digital Converter ◽  
Dynamic Comparator ◽  
Analog To Digital ◽  
Calibration Algorithm

This paper presents a foreground digital calibration algorithm based on a dynamic comparator that aims to reduce comparator offset and capacitor mismatch, as well as improve the performance of the successive approximation analog-to-digital converter (SARADC). The dynamic comparator is designed with two preamplifiers and one latch to facilitate high speed, high precision, and low noise. The foreground digital calibration algorithm provides high speed with minimal area consumption. This design is implemented on a 12-bit 30 MS/s SARADC with a standard 0.13 μm Complementary Metal Oxide Semiconductor (CMOS) process. The simulation Nyquist 68.56 dB signal-to-noise-and-distortion ratio (SNDR) and 84.45 dBc spurious free dynamic range (SFDR) at 30 MS/s, differential nonlinearity (DNL) and integral nonlinearity (INL) are within 0.64 Least Significant Bits (LSB) and 1.3 LSB, respectively. The ADC achieves an effective number of bits (ENOB) of 11.08 and a figure-of-merit (FoM) of 39.45 fJ/conv.-step.

scholarly journals Modeling of High-Resolution Data Converter: Two-Step Pipelined-SAR ADC based on ISDM

Electronics ◽  
2020 ◽  
Vol 9 (1) ◽  
pp. 137 ◽  
Author(s):  
Bo Gao ◽  
Xin Li ◽  
Jie Sun ◽  
Jianhui Wu
Keyword(s):  
High Resolution ◽  
Low Noise ◽  
Sar Adc ◽  
Total Power ◽  
Cmos Process ◽  
Analog To Digital Converter ◽  
Digital Converter ◽  
Signal To Noise ◽  
Analog To Digital ◽  
High Bandwidth

The features of high-resolution and high-bandwidth are in an increasing demand considering to the wide range application fields based on high performance data converters. In this paper, a modeling of high-resolution hybrid analog-to-digital converter (ADC) is proposed to meet those requirements, and a 16-bit two-step pipelined successive approximation register (SAR) analog-to-digital converter (ADC) with first-order continuous-time incremental sigma-delta modulator (ISDM) assisted is presented to verify this modeling. The combination of high-bandwidth two-step pipelined-SAR ADC with low noise ISDM and background comparator offset calibration can achieve higher signal-to-noise ratio (SNR) without sacrificing the speed and plenty of hardware. The usage of a sub-ranging scheme consists of a coarse SAR ADC followed by an fine ISDM, can not only provide better suppression of the noise added in 2nd stage during conversion but also alleviate the demands of comparator’s resolution in both stages for a given power budget, compared with a conventional Pipelined-SAR ADC. At 1.2 V/1.8 V supply, 33.3 MS/s and 16 MHz input sinusoidal signal in the 40 nm complementary metal oxide semiconductor (CMOS) process, the post-layout simulation results show that the proposed hybrid ADC achieves a signal-to-noise distortion ratio (SNDR) and a spurious free dynamic range (SFDR) of 86.3 dB and 102.5 dBc respectively with a total power consumption of 19.2 mW.

100 MS/s, 10-BIT ADC USING PIPELINED SUCCESSIVE APPROXIMATION

2014 ◽  
Vol 23 (05) ◽  
pp. 1450057
Author(s):  
SAHAR SARAFI ◽  
KHEYROLLAH HADIDI ◽  
EBRAHIM ABBASPOUR ◽  
ABU KHARI BIN AAIN ◽  
JAVAD ABBASZADEH
Keyword(s):  
Successive Approximation ◽  
Sar Adc ◽  
Cmos Process ◽  
Pipelined Adc ◽  
Analog To Digital Converter ◽  
Digital Converter ◽  
Process Technology ◽  
Total Conversion ◽  
Analog To Digital ◽  
Simulation Results

This paper presents an analog-to-digital converter (ADC), using pipelined successive approximation register (SAR) architecture. The structure which is a combination of SAR-ADC and pipelined ADC benefits from each of their advantages. A new synchronization method is proposed to improve the pipelined SAR-ADC's speed. The proposed method reduces the total conversion without limiting the ADC performance. To evaluate the proposed method a 10-bit 100 MS/s is designed in 0.5 μm CMOS process technology. According to the obtained simulation results, the designed ADC digitizes a 9-MHz input with 54.19 dB SNDR while consuming 57.3 mw from a 5-V supply.

AN OPTIMIZED LOW POWER PIPELINE ANALOG-TO-DIGITAL CONVERTER FOR HIGH-SPEED WLAN APPLICATION

2014 ◽  
Vol 23 (05) ◽  
pp. 1450059 ◽  
Author(s):  
MAO YE ◽  
BIN WU ◽  
YONGXU ZHU ◽  
YUMEI ZHOU
Keyword(s):  
Low Power ◽  
Power Dissipation ◽  
High Speed ◽  
Dynamic Range ◽  
Cmos Process ◽  
Area Network ◽  
Analog To Digital Converter ◽  
Digital Converter ◽  
Silicon Area ◽  
Analog To Digital

This paper presents the design and implementation of a 11-bit 160 MSPS analog-to-digital converter (ADC) for next generation super high-speed wireless local area network (WLAN) application. The ADC core consists of one front sample and hold stage and four cascades of 2.5 bit pipeline stages with opamp sharing between successive stages. To achieve low power dissipation at 1.2 V supply, a single stage symmetrical amplifier with double transimpedance gain-boosting amplifier is proposed. High speed on-chip reference buffer with replica source follower is also included for linearity performance. The ADC was fabricated in a standard 130-nm CMOS process and an occupied silicon area of 0.95 mm × 1.15 mm. Performance of 73 dB spurious-free-dynamic-range is measured at 160 MS/s with 1 Vpp input signal. The power dissipation of the analog core chip is only 50 mW from a 1.2 V supply.

Low Area and High Bit Resolution Flash Analog to Digital Converter for Wide Band Applications: A Review

2021 ◽  
Vol 13 ◽  
Author(s):  
Banoth Krishna ◽  
Sandeep Singh Gill ◽  
Amod Kumar
Keyword(s):  
High Speed ◽  
Wide Band ◽  
Low Noise ◽  
Analog To Digital Converter ◽  
Digital Converter ◽  
Digital To Analog Converter ◽  
Flash Adc ◽  
Analog To Digital ◽  
Power Efficient ◽  
Low Area

: This work reviews the design challenges of CMOS flash type analog-to-digital converter (ADC) for making high bit resolution, low area, low noise, low offset, and power-efficient architecture. Low-bit resolution flash ADC architecture, high-speed applications, and wide-area parallel comparators are identified on their suitability of the design for ADCs. These are effective in the area and bit resolution. The overview includes bit resolution, area, power dissipation, bandwidth and offset noise consideration for high-speed flash ADC design. A MUX-based two-step half flash architecture is considered for applications requiring 1 GHz 16-bit resolution low area and low power consumption. An advanced comparator, MUX, a high-speed digital-to-analog converter(DAC), and MUX-based encoder are also reviewed. The design of technology-efficient ADC architecture is highly challenging for the analog designer.

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