Characterization of hetero interfaces in InP/In/sub 75/Ga/sub 25/As/InP HFETs by means of digital signal processing of measured low frequency noise spectra
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2009 ◽
Vol 80
(8)
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pp. 083906
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2020 ◽
Vol 67
(2)
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pp. 547-551
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2012 ◽
Vol 131
(4)
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pp. 3257-3257