A novel approach for precise characterization of long distance mismatch of CMOS-devices
2001 ◽
Vol 14
(4)
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pp. 311-317
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1994 ◽
Vol 269
(35)
◽
pp. 22178-22187
2020 ◽
Vol 22
(35)
◽
pp. 19468-19479
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Keyword(s):
Keyword(s):