A new robust on-wafer 1/f noise measurement and characterization system

Author(s):  
A. Blaum ◽  
O. Pilloud ◽  
G. Scalea ◽  
J. Victory ◽  
F. Sischka
Keyword(s):  
2013 ◽  
Vol E96.C (2) ◽  
pp. 241-244
Author(s):  
Ryuta YAMANAKA ◽  
Taka FUJITA ◽  
Hideyuki SOTOBAYASHI ◽  
Atsushi KANNO ◽  
Tetsuya KAWANISHI

1992 ◽  
Author(s):  
J. A. Molnar ◽  
T. V. Mai ◽  
J. J. O'Neill
Keyword(s):  

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