A Single Event Transient Harden Structure for Flip-Flop with RC Filter

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905068 ◽

2018 ◽

Author(s):

ZHOU Xinjie ◽

ZHOU Xiaobin ◽

LIU Zhun ◽

Tao Wei ◽

GUO Gang ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

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SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET

2019 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2019.8720513 ◽

2019 ◽

Author(s):

Taiki Uemura ◽

Soonyoung Lee ◽

Dahye Min ◽

Ihlhwa Moon ◽

Seungbae Lee ◽

...

Keyword(s):

Single Event Upset ◽

Single Event ◽

Single Event Transient ◽

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Novel time redundant flip-flop structure to attenuate the single-event transient

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2016.7998693 ◽

2016 ◽

Author(s):

Chunmei Hu ◽

Yankang Du ◽

Jianjun Chen ◽

Yaqing Chi ◽

Haiyan Chen

Keyword(s):

Single Event ◽

Single Event Transient ◽

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Study on the hardening of single-event transient in D-type flip-flop based on InP HBT

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict49897.2020.9278212 ◽

2020 ◽

Author(s):

Yutao Zhang ◽

Hongliang Lv ◽

Yuming Zhang ◽

Yimen Zhang ◽

Xiaohong Zhao ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

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Single Event Transient (SET) Mitigation Circuits with Immune Leaf Nodes

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2021.3051846 ◽

2021 ◽

pp. 1-1

Author(s):

Faisal Mustafa Sajjade ◽

Neeraj Kumar Goyal ◽

B.K.S.V.L Varaprasad

Keyword(s):

Single Event ◽

Single Event Transient

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Impact of displacement damage on single event transient charge collection in SiGe HBTs

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2019.05.098 ◽

2019 ◽

Vol 938 ◽

pp. 29-35 ◽

Author(s):

Jia-nan Wei ◽

Chao-hui He ◽

Pei Li ◽

Yong-hong Li ◽

Hong-xia Guo

Keyword(s):

Charge Collection ◽

Single Event ◽

Single Event Transient ◽

Displacement Damage

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Single event transient characterisation of analog IC's for ESA's satellites

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858650 ◽

2003 ◽

Author(s):

R. Harboe-Sorensen ◽

F.X. Guerre ◽

H. Constans ◽

J. van Dooren ◽

G. Berger ◽

...

Keyword(s):

Single Event ◽

Single Event Transient

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Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896269 ◽

2002 ◽

Author(s):

R. Koga ◽

S.H. Crain ◽

K.B. Crawford ◽

S.C. Moss ◽

S.D. LaLumondiere ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Radiation Hardened

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Single-event transient (SET) characterization of a LM119 voltage comparator: an approach to SET model validation using a pulsed laser

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) ◽

10.1109/radecs.2001.1159318 ◽

2005 ◽

Author(s):

S. Buchner ◽

D. McMorrow ◽

A. Sternberg ◽

L. Massengill ◽

R.L. Pease ◽

...

Keyword(s):

Model Validation ◽

Pulsed Laser ◽

Single Event ◽

Single Event Transient ◽

Voltage Comparator

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Investigation of a layout technique for single-event transient mitigation

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2016.7998689 ◽

2016 ◽

Author(s):

Luo Sheng ◽

He Wei ◽

Zhang Zhun ◽

He Lingxiang ◽

Cao Jianmin ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Layout Technique

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Towards a single event transient hardness assurance methodology

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) ◽

10.1109/radecs.2001.1159305 ◽

2005 ◽

Author(s):

R. Marec ◽

C. Chatry ◽

P. Adell ◽

O. Mion ◽

C. Barillot ◽

...

Keyword(s):

Single Event ◽

Single Event Transient

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