2019 IEEE International Reliability Physics Symposium (IRPS)
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TOTAL DOCUMENTS

179
(FIVE YEARS 179)

H-INDEX

4
(FIVE YEARS 4)

Published By IEEE

9781538695043
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM

2019 ◽  
Author(s):  
Shouhei Fukuyama ◽  
Atsuna Hayakawa ◽  
Ryutaro Yasuhara ◽  
Shinpei Matsuda ◽  
Hiroshi Kinoshita ◽  
...  
Keyword(s):  
Comprehensive Analysis ◽  
Data Retention ◽  
Trade Off

eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology

2019 ◽  
Author(s):  
James A. O'Donnell ◽  
Chris Connor ◽  
Tanmoy Pramanik ◽  
Jeff Hicks ◽  
Juan G. Alzate ◽  
...  
Keyword(s):  
Reliability Modeling

Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery

2019 ◽  
Author(s):  
Elnatan Mataev ◽  
James Stathis ◽  
Giuseppe La Rosa ◽  
Barry P. Linder
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