2019 IEEE International Reliability Physics Symposium (IRPS)
Latest Publications

TOTAL DOCUMENTS

179
(FIVE YEARS 0)

H-INDEX

4
(FIVE YEARS 0)

Published By IEEE

9781538695043
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Robust BEOL MIMCAP for Long and Controllable TDDB Lifetime

2019 ◽  
Author(s):  
Lili Cheng ◽  
Seungman Choi ◽  
Sean Ogden ◽  
Teck Jung Tang ◽  
Robert Fox

Degradation Monitoring –– from a Vision to Reality

2019 ◽  
Author(s):  
Evelyn Landman ◽  
Shai Cohen ◽  
Noam Brousard ◽  
Raanan Gewirtzman ◽  
Inbar Weintrob ◽  
...  
Keyword(s):  
Degradation Monitoring

Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM

2019 ◽  
Author(s):  
Shouhei Fukuyama ◽  
Atsuna Hayakawa ◽  
Ryutaro Yasuhara ◽  
Shinpei Matsuda ◽  
Hiroshi Kinoshita ◽  
...  
Keyword(s):  
Comprehensive Analysis ◽  
Data Retention ◽  
Trade Off

eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology

2019 ◽  
Author(s):  
James A. O'Donnell ◽  
Chris Connor ◽  
Tanmoy Pramanik ◽  
Jeff Hicks ◽  
Juan G. Alzate ◽  
...  
Keyword(s):  
Reliability Modeling

scholarly journals Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-Mode Transistors

2019 ◽  
Author(s):  
A. Tajalli ◽  
E. Canato ◽  
A. Nardo ◽  
M. Meneghini ◽  
A. Stockman ◽  
...  
Keyword(s):  
Dynamic Performance ◽  
Gan On Si

Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery

2019 ◽  
Author(s):  
Elnatan Mataev ◽  
James Stathis ◽  
Giuseppe La Rosa ◽  
Barry P. Linder
Load More ...
Sign in / Sign up

Export Citation Format

Share Document