Methods of Detecting Latent Defects in Cells of the Super-Operative Memory of Microcircuits Used in the Digital Signal Processing Systems

Author(s):  
K. K. Smirnov ◽  
M. N. Ushkar ◽  
A. V. Nazarov ◽  
V. V. Blinov
2012 ◽  
Vol 2012 (1) ◽  
Author(s):  
Gabriel Caffarena ◽  
Olivier Sentieys ◽  
Daniel Menard ◽  
Juan A. López ◽  
David Novo

2007 ◽  
Vol 2007 ◽  
pp. 1-22 ◽  
Author(s):  
Christian Haubelt ◽  
Joachim Falk ◽  
Joachim Keinert ◽  
Thomas Schlichter ◽  
Martin Streubühr ◽  
...  

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